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QTL mapping of resistance to race Ug99 of Puccinia graminis f. sp. tritici in durum wheat (Triticum durum Desf.)

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Abstract

Stem rust caused by Puccinia graminis f. sp. tritici was historically one of the most destructive diseases of wheat worldwide. The evolution and rapid migration of race TTKSK (Ug99) and derivatives, first detected in Uganda in 1999, are of international concern due to the virulence of these races to widely used stem rust resistance genes. In attempts to identify quantitative trait loci (QTL) linked with resistance to stem rust race Ug99, 95 recombinant inbred lines that were developed from a cross between two durum wheat varieties, Kristal and Sebatel, were evaluated for reaction to stem rust. Seven field trials at two locations were carried out in main and off seasons. In addition to the natural infection, the nursery was also artificially inoculated with urediniospores of stem rust race Ug99 and a mixture of locally collected stem rust urediniospores. A genetic map was constructed based on 207 simple sequence repeat (SSR) and two sequence tagged site loci. Using composite interval mapping, nine QTL for resistance to stem rust were identified on chromosomes 1AL, 2AS, 3BS, 4BL, 5BL, 6AL 7A, 7AL and 7BL. These results suggest that durum wheat resistance to stem rust is oligogenic and that there is potential to identify previously uncharacterized resistance genes with minor effects. The SSR markers that are closely linked to the QTL can be used for marker-assisted selection for stem rust resistance in durum wheat.

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Abbreviations

ANOVA:

Analysis of variance

APR:

Adult plant resistance

BARC:

Beltsville Agriculture Research Center

BLUP:

Best linear unbiased prediction

CIM:

Composite interval mapping

cM:

Centimorgan

DN:

Denbi

DZ:

Debre Zeit

GS:

Growth stage

GWM:

Gatersleben wheat microsatellite

IM:

Interval mapping

LOD:

Likelihood of odds ratio

MAS:

Marker-assisted selection

MS:

Main season

OS:

Off season

PCR:

Polymerase chain reaction

Pgt :

Puccinia graminis f. sp. tritici

QTL:

Quantitative trait loci or Quantitative trait locus

RFLP:

Restriction fragment length polymorphism

RIL:

Recombinant inbred line

SR:

Stem rust severity

SSD:

Single seed descent

SSR:

Simple sequence repeat

STS:

Sequence tagged site

WMC:

Wheat Microsatellite Consortium

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Acknowledgments

The authors are thankful to Debre Zeit Agricultural Research Centre, Ethiopia, for maintaining experimental plots and financial support for the field work. Field and technical assistances rendered by Bethelhem Hibdo and Chuchu Kebede during the field work and help in data analysis by Dr. Sonja Kollers are gratefully acknowledged. The authors are also thankful for the assistance provided by technical staff of the gene and genome mapping unit of the Cytogenetics and Genome Analysis Department at IPK Gatersleben. We pay attribute to the German Academic Exchange Service (DAAD) and Ethiopian Institute of Agricultural Research (EIAR) for awarding a PhD scholarship and giving leave of absence, respectively, to Jemanesh Kifetew Haile.

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Correspondence to Marion S. Röder.

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Haile, J.K., Nachit, M.M., Hammer, K. et al. QTL mapping of resistance to race Ug99 of Puccinia graminis f. sp. tritici in durum wheat (Triticum durum Desf.). Mol Breeding 30, 1479–1493 (2012). https://doi.org/10.1007/s11032-012-9734-7

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