Simulation of Sensitive Element Found on Planar Mushroom-Shaped Metamaterial for Nondestructive Testing and Searching for Inhomogeneities in Technological Media

Measurement Techniques volume 63, pages828–833(2021)Cite this article

A computer model of a sensitive element on a planar mushroom-shaped metamaterial with Maltese cross-type cells is created. Results of a numerical experiment are presented. It is own that this type of electrodynamic structure may be used in nondestructive testing of the geometric and electro-physical parameters of technological media as well as in searching in these media for inhomogeneities relative to variations of the attenuation coefficient and relative to the resonant frequency of the sensitive element.

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Affiliations

  1. National Research University Higher School of Economics (HSE), Moscow, Russia

    A. A. Yelizarov, A. A. Skuridin & E. A. Zakirova

Authors
  1. A. A. Yelizarov
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  2. A. A. Skuridin
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  3. E. A. Zakirova
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Correspondence to A. A. Yelizarov.

Additional information

Translated from Izmeritel’naya Tekhnika, No. 10, pp. 54–59, October, 2020.

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Yelizarov, A.A., Skuridin, A.A. & Zakirova, E.A. Simulation of Sensitive Element Found on Planar Mushroom-Shaped Metamaterial for Nondestructive Testing and Searching for Inhomogeneities in Technological Media. Meas Tech 63, 828–833 (2021). https://doi.org/10.1007/s11018-021-01860-1

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Keywords

  • sensitive element
  • mushroom-shaped metamaterial
  • resonance frequency
  • attenuation coefficient
  • technological medium
  • nondestructive testing
  • search for inhomogenities