Wavelet Analysis of Ceramic Surface Images as a Method for Measuring the Size of Structural Elements

The problem of the possibility of visualizing multiscale phenomena developing on the surface of a ceramic material, which is characterized by a high dispersion of structural elements, is important for modern materials science. The relevance of using wavelet analysis to visualize and measure the structural elements of the surface of ceramic samples is shown. The experimental results of processing images of the surface of samples using wavelet analysis are presented. Examples of applying the wavelet transform to the study of model “chessboard” images with simple geometry and precisely known sizes of structural elements are observed. A relation that relates the particle size to the scale parameter of the wavelet spectrum is derived. A simple method for recording and quantifying the structural changes occurring in highly dispersed ceramic samples under the influence of a microwave field is proposed. The effect of reducing the size of structural elements (particles) of the surface of such ceramic samples influenced by microwave radiation by an average of 20% is discovered. The surface of such samples becomes more uniform, which is extremely promising for the development of technology for producing finely dispersed ceramic materials.

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Correspondence to M. M. Filyak.

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Translated from Izmeritel’naya Tekhnika, No. 2, pp. 50–54, February, 2020.

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Filyak, M.M., Chetverikova, A.G., Kanygina, O.N. et al. Wavelet Analysis of Ceramic Surface Images as a Method for Measuring the Size of Structural Elements. Meas Tech 63, 130–134 (2020). https://doi.org/10.1007/s11018-020-01761-9

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Keywords

  • wavelet spectrum
  • scale parameter
  • model
  • optical image
  • visualization
  • structural element
  • ceramic surface