Skip to main content
Log in

A Device for Mechanical Testing of Elements of Micro- and Nanosystems

  • MECHANICAL MEASUREMENTS
  • Published:
Measurement Techniques Aims and scope

For the mechanical testing of elements of micro- and nanosystems, we propose a device based on an electrodynamic actuator, which creates regulated forces within the range 10–3–1 N. The minimum recorded change in the geometry of a specimen under the load is equal to 0.3 μm. The actuator can be used for tensile, bending, compression, and fatigue tests of the specimens. By using the actuator, we can find the mechanical characteristics of thin films, wires, and microbeams whose length varies from several micrometers to several millimeters. The accessibility of the actuator and its zero stiffness simplify the procedure of measurements.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Fig. 1.
Fig. 2.
Fig. 3.

Similar content being viewed by others

References

  1. T. Tsuchiya, Reliability of MEMS: Testing of Materials and Devices, Wiley, New York (2008), Vol. 6.

    Google Scholar 

  2. S. Rigo, J. M. Desmarres, T. Masri, and J. A. Petit, “Measurement of the residual stresses of the handing structures used in MEMS,” in: Design, Test, Integration, and Packaging of MEMS/MOEMS 2002, Cannes, France, May 5–8, 2002, Proc. SPIE (2002), pp. 704–713.

  3. T. P. Weihs, S. Hong, J. C. Bravman, and W. D. Nix, “Mechanical deflection of cantilever microbeams: A new technique for testing the mechanical properties of thin films,” J. Mater. Res., No. 3, 931–942 (1988).

  4. R. Liu, H. Wang, X. Li, G. Ding, and C. Yang, “A microtensile method for measuring mechanical properties of MEMS materials,” J. Micromech. Microeng., 18 (065002) (2008), DOI:https://doi.org/10.1088/0960-1317/18/6/065002.

  5. S. G. Richard and R. P. Jon, “Prototype cantilevers for SI-traceable nanonewton force calibration, ”Meas. Sci. Technol., No.17, 2852–2860 (2006).

  6. I. V. Uvarov, O. V. Morozov, I. A. Kozin, A. V. Postnikov, I. I. Amirov, and V. A. Kal’nov, “Dynamic characteristics of the sensitive element of a microaccelerometer with elevated damping factor,” Nano-Microsist. Tekhn., No. 12, 38–40 (2011).

Download references

The present work was carried out within the framework of State Assignment No. 007-00018-16-02 of the Russian Federal Agency of Scientific Organizations.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to А. V. Postnikov.

Additional information

Translated from Izmeritel’naya Tekhnika, No. 8, pp. 43–46, August, 2018.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Postnikov, А.V. A Device for Mechanical Testing of Elements of Micro- and Nanosystems. Meas Tech 61, 802–805 (2018). https://doi.org/10.1007/s11018-018-1505-3

Download citation

  • Received:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s11018-018-1505-3

Keywords

Navigation