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Measurement Techniques

, Volume 59, Issue 2, pp 160–163 | Cite as

Metrological Assurance of Devices Intended to Measure the Parameters of Pulsed Electric and Magnetic Fields of Natural and Artificial Origin

  • K. Yu. Sakharov
  • V. A. Turkin
  • O. V. Mikheev
  • M. I. Dobrotvorskii
  • A. V. Sukhov
  • A. I. Aleshko
Article
  • 29 Downloads

Issues are examined related to the improvement of State Primary Special Standard GET 148–2013, for units of pulsed electric and magnetic field strength having a pulse leading-edge duration in the range from 0.1 to 10.0 nsec, as well as the improvement of secondary standards. The goal of the improvement is to provide metrological assurance of devices intended to measure the parameters of pulsed electric and magnetic fields of natural and artificial origin in the range up to 1 MV/m with a pulse leading-edge time not exceeding 100 psec.

Keywords

standard electromagnetic pulse subnanosecond range TEM-cell 

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Copyright information

© Springer Science+Business Media New York 2016

Authors and Affiliations

  • K. Yu. Sakharov
    • 1
  • V. A. Turkin
    • 1
  • O. V. Mikheev
    • 1
  • M. I. Dobrotvorskii
    • 1
  • A. V. Sukhov
    • 1
  • A. I. Aleshko
    • 1
  1. 1.All-Russia Research Institute of Optophysical Measurements (VNIIOFI)MoscowRussia

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