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Measurement Techniques

, Volume 58, Issue 10, pp 1156–1159 | Cite as

Measurement of the Temperature of Sheet Materials in Microwave Traveling-Wave Structures

  • V. N. Nefedov
  • A. V. Mamontov
  • V. P. Simonov
  • V. V. Afanas’ev
Article
  • 36 Downloads

The results of theoretical and experimental investigations in the area of high performance microwave technologies for the heat treatment of sheet materials are presented. Two-dimensional periodic slow-wave systems are used as the heating elements of the microwave devices. The disagreement between the theoretical and experimental temperature distribution characteristics in the sheet material and the temperature deviation from the nominal value does not exceed 3% and 5%, respectively.

Keywords

microwave device temperature distribution dielectric material slow-wave structure 

References

  1. 1.
    A. V. Mamontov, V. N. Nefedov, I. V. Nazarov, and T. A. Potapova, Microwave Technologies: Monograph, Research Institute of Promising Materials and Technologies of Moscow Institute of Electronics and Mathematics (Technical University), Moscow (2008).Google Scholar
  2. 2.
    S. Yu. Shakhbazov, M. V. Nefedov, E. V. Nikishin, et al., “Measurement of the temperature field distribution over the thickness of sheet materials in microwave traveling-wave devices,” Metrologiya, No. 5, 38–44 (2008).Google Scholar
  3. 3.
    I. V. Nazarov, M. V. Nefedov, T. A. Potapova, and A. V. Mamontov, “Measurement of the temperature field distribution over the cross section of materials in a microwave traveling wave field,” Metrologiya, No. 3, 9–20 (2006).Google Scholar

Copyright information

© Springer Science+Business Media New York 2015

Authors and Affiliations

  • V. N. Nefedov
    • 1
  • A. V. Mamontov
    • 1
  • V. P. Simonov
    • 1
  • V. V. Afanas’ev
    • 1
  1. 1.National Research University – Higher School of EconomicsMoscowRussia

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