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Measurement Techniques

, Volume 52, Issue 12, pp 1351–1357 | Cite as

An experimental investigation of the stability of CMOS-logic integrated Schmitt triggers to ultra-short pulse overloads

  • A. M. Bobreshov
  • A. V. Dyboi
  • Yu. Yu. Razuvaev
  • G. K. Uskov
Article
  • 35 Downloads

The degradation of semiconductor CMOS structures due to the action of overloads in the form of ultra-short video pulses is investigated. It is shown that these video pulses in Schmitt triggers produce a change in the threshold voltages and a contraction of the area of uncertainty. In buffer elements, intense phase noise occurs, while in RC generators there is a change in the length and repetition frequency of the pulses generated. Experimental equipment for determining the critical parameters of the actions of ultra-short video pulses on a sample of digital microcircuits and CMOS structures is described.

Key words

Schmitt trigger CMOS structures electromagnetic compatibility ultra-short video pulses 

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Copyright information

© Springer Science+Business Media, Inc. 2009

Authors and Affiliations

  • A. M. Bobreshov
    • 1
  • A. V. Dyboi
    • 1
  • Yu. Yu. Razuvaev
    • 1
  • G. K. Uskov
    • 1
  1. 1.Voronezh State UniversityVoronezhRussia

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