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Measurement Techniques

, Volume 48, Issue 5, pp 471–475 | Cite as

The Use of Correlation Analysis of the Image in Phase Optoelectronic Devices

  • V. P. Soldatov
Article
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Abstract

The possibility of using phase-correlation analysis of an image in optoelectronic devices to measure small angular and linear displacements of objects is considered. It is shown that the measurement accuracy is thereby increased.

Key words

optoelectronic system correlation analysis of the image accuracy of displacement measurement 

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REFERENCES

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    G. M. Mosyagin et al., Theory of Optoelectronic Systems [in Russian], Mashinostroenie, Moscow (1990).Google Scholar

Copyright information

© Springer Science+Business Media, Inc. 2005

Authors and Affiliations

  • V. P. Soldatov

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