In this article statistical inference for the failure time distribution of a product from “field return data”, that records the time between the product being shipped and returned for repair or replacement, is described. The problem that is addressed is that the data are not failure times because they also include the time that it took to ship and install the product and then to return it to the manufacturer for repair or replacement. The inference attempts to infer the distribution of time to failure (that is, from installation to failure) from the data when in addition there are separate data on the times from shipping to installation, and from failure to return. The method is illustrated with data from units installed in a telecommunications network.
Bayesian inference Field return data Reliability Warranty
This is a preview of subscription content, log in to check access.
Albert JRG, Baxter LA (1995) Applications of the EM algorithm to the analysis of life length data. J R Stat Soc Ser C 44: 322–341Google Scholar
Chiodo E, Maxxanti A (2006) Bayesian reliability estimation based on a Weibull stress-strength model for aged power system components subjected to voltage surges. IEEE Trans Dielectr Electr Insulat 13: 146–159CrossRefGoogle Scholar
Fernández AJ, Bravo JI, Fuentes ID (1999) Parametric estimation of reliability from incomplete and doubly censored data. Commun Stat Theory Methods 28: 2395–2416MATHCrossRefGoogle Scholar