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Enhanced ferroelectric, dielectric and leakage properties in Ce and Ti co-doping BiFeO3 thin films

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Abstract

Pure BiFeO3 (BFO), Ce and Ti individual doping and co-doping BiFeO3 thin films were fabricated via sol–gel process on Pt/Ti/SiO2/Si substrates. The microstructure, surface morphology, ferroelectric and dielectric properties of BFO and doped thin films were investigated in detail. X-ray diffraction reveal that all thin films are confirmed the formation of the distorted rhombohedral perovskite structure. No impure phase is identified in all the films. The Ce and Ti co-doping BiFeO3 (BCFTO) thin films exhibited the enhanced ferroelectricity with a large remnant polarization (2P r) of 130 μC/cm2, and low leakage current density of 9.10 × 10−6 A/cm2 which is more than two orders of magnitude lower than that of pure BFO films at 100 kV/cm. The dielectric constant (364 at 1 kHz) of the BCFTO thin films is much larger than that of pure BFO thin films. These results suggest that the introductions of Ce and Ti provides an effective route for improving the ferroelectric, dielectric and leakage properties of BFO thin films.

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References

  1. Picozzi S, Ederer C (2009) J Phys Condens Matter 21:303201

    Article  Google Scholar 

  2. Balke N, Choudhury S, Jesse S, Huijben M, Chu YH, Baddorf AP, Chen LQ, Ramesh R, Kalinin SV (2009) Nat Nanotechnol 4:868–875

    Article  Google Scholar 

  3. Xu JL, Xie D, Yin C, Feng TT, Zhang XW, Li G, Zhao HM, Zhao YF, Ma S, Ren TL, Guan YJ, Gao XS, Zhao YG (2013) J Appl Phys 114:154103

    Article  Google Scholar 

  4. Raghavan CM, Kim JW, Kim SS (2013) J Sol–Gel Sci Technol 67:486–491

    Article  Google Scholar 

  5. Rao SS, Prater JT, Wu F, Shelton CT, Maria JP, Narayan J (2013) Nano Lett 13:5814–5821

    Article  Google Scholar 

  6. Choi T, Lee S, Choi YJ, Kiryukhin V, Cheong SW (2009) Science 324:63–66

    Article  Google Scholar 

  7. Neaton JB, Ederer C, Waghmare UV, Spaldin NA, Rabe KM (2005) Phys Rev B 71:014113

    Article  Google Scholar 

  8. Raghavan CM, Kim JW, Kim SS (2014) J Am Ceram Soc 97:235–240

    Article  Google Scholar 

  9. Hu GD, Cheng X, Wu WB, Yang CH (2007) Appl Phys Lett 91:232909

    Article  Google Scholar 

  10. Wu JG, Qiao S, Wang J, Xiao DQ, Zhu JG (2013) Appl Phys Lett 102:052904

    Article  Google Scholar 

  11. Gu JJ, Yang SM, Yang W, Qi YK, Zhao GL, Sun HY (2014) J Magn Magn Mater 349:140–143

    Article  Google Scholar 

  12. Cai W, Zhong SX, Fu CL, Chen G, Deng XL (2014) Mater Res Bull 50:259–267

    Article  Google Scholar 

  13. Simoes AZ, Cavalcante LS, Riccardi CS, Varela JA, Longo E (2007) J Sol–Gel Sci Technol 44:269–273

    Article  Google Scholar 

  14. Quan ZC, Liu W, Hu H, Xu S, Sebo B, Fang GJ, Li MY, Zhao XZ (2008) J Appl Phys 104:084102

    Article  Google Scholar 

  15. Xiao RZ, Pelenovich VO, Fu DJ (2013) Appl Phys Lett 103:012602

    Article  Google Scholar 

  16. Darby MSB, Karpinsky DV, Pokorny J, Guerind S, Kholkin AL, Miao S, Hayden BE, Reaney IM (2013) Thin Solid Films 531:56–60

    Article  Google Scholar 

  17. Xue X, Tan GQ, Ren HJ, Xia A (2013) Ceram Int 39:6223–6228

    Article  Google Scholar 

  18. Pei L, Hu N, Deng G, Chen YW, Bie YG, Li MY, Liu XL (2012) J Sol–Gel Sci Technol 64:711–717

    Article  Google Scholar 

  19. Liu HR, Liu ZL, Yao KL (2007) J Sol–Gel Sci Technol 41:123–128

    Article  Google Scholar 

  20. Kim JK, Kim SS, Kim W, Bhalla AS, Guo R (2006) Appl Phys Lett 88:132901

    Article  Google Scholar 

  21. Tang XW, Dai JM, Zhu XB, Sun YP (2013) J Alloys Compd 552:186–189

    Article  Google Scholar 

  22. Ding NF, Deng HM, Yang PX, Chu JH (2012) Mater Lett 82:71–73

    Article  Google Scholar 

  23. Luo LR, Wei W, Yuan XY, Shen K, Xu MX, Xu QY (2012) J Alloys Compd 540:36–38

    Article  Google Scholar 

  24. Liu J, Li MY, Pei L, Yu BF, Guo DY, Zhao XZ (2009) J Phys D Appl Phys 42:115409

    Article  Google Scholar 

  25. Kim JW, Kim SS, Kim HJ, Kim WJ, Raghavan CM, Do D, Lee MH, Song TK, Kim MH (2013) J Electroceram 30:13–18

    Article  Google Scholar 

  26. Dong GH, Tan GQ, Liu WL, Xia A, Ren HJ (2013) J Mater Sci: Mater Electron 24:4445–4451

    Google Scholar 

  27. Dong GH, Tan GQ, Luo YY, Liu WL, Ren HJ, Xia A (2013) Appl Surf Sci 290:280–286

    Article  Google Scholar 

  28. Zhang XY, Song Q, Xu F, Ong CK (2009) Appl Phys Lett 94:022907

    Article  Google Scholar 

  29. Li K, Rémiensb D, Dong XL, Costecalde J, Sama N, Lei XY, Li T, Du G, Wang GS (2013) Mater Lett 107:361–363

    Article  Google Scholar 

  30. Lazenka VV, Lorenz M, Modarresi H, Brachwitz K, Schwinkendorf P, Bontgen T, Vanacken J, Ziese M, Grundmann M, Moshchalkov VV (2013) J Phys D Appl Phys 46:175006

    Article  Google Scholar 

Download references

Acknowledgments

This work was financially supported by Key Project of National Natural Science Foundations of China (NSFC) (Grant No. 11032010), NSFC (Grant No. 61274107), 973 Program (Grant No. 2012CB326404), Key Project of Hunan Provincial NSFC (Grant No. 13JJ2023), Key Project of Scientific Research Fund of Hunan Provincial Educations Department (Grant No. 12A129), Hunan Provincial Innovations Foundations for Postgraduate (Grant Nos. CX2013B257 and CX2013B261), and the Opening Project of Science and Technology on Reliability Physics and Applications Technology of Electronic Component Laboratory (ZHD201304).

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Correspondence to M. H. Tang.

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Zeng, J., Tang, Z.H., Tang, M.H. et al. Enhanced ferroelectric, dielectric and leakage properties in Ce and Ti co-doping BiFeO3 thin films. J Sol-Gel Sci Technol 72, 587–592 (2014). https://doi.org/10.1007/s10971-014-3481-7

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  • DOI: https://doi.org/10.1007/s10971-014-3481-7

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