Advanced gamma spectrum processing technique applied to the analysis of scattering spectra for determining material thickness
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In this work, an advanced gamma spectrum processing technique is applied to analyze experimental scattering spectra for determining the thickness of C45 heat-resistant steel plates. The single scattering peak of scattering spectra is taken as an advantage to measure the intensity of single scattering photons. Based on these results, the thickness of steel plates is determined with a maximum deviation of real thickness and measured thickness of about 4 %. Monte Carlo simulation using MCNP5 code is also performed to cross check the results, which yields a maximum deviation of 2 %. These results strongly confirm the capability of this technique in analyzing gamma scattering spectra, which is a simple, effective and convenient method for determining material thickness.
KeywordsNaI(Tl) Compton scattering Thickness of material Spectrum processing technique Spectroscopy
The authors are grateful to Vietnamese Ministry of Industry of Trade, VNUHCM-University of Science and Ho Chi Minh City University of Pedagogy for supporting this work.
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