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Journal of Radioanalytical and Nuclear Chemistry

, Volume 303, Issue 1, pp 693–699 | Cite as

Advanced gamma spectrum processing technique applied to the analysis of scattering spectra for determining material thickness

  • Hoang Duc Tam
  • Huynh Dinh Chuong
  • Tran Thien Thanh
  • Vo Hoang Nguyen
  • Hoang Thi Kieu Trang
  • Chau Van Tao
Article

Abstract

In this work, an advanced gamma spectrum processing technique is applied to analyze experimental scattering spectra for determining the thickness of C45 heat-resistant steel plates. The single scattering peak of scattering spectra is taken as an advantage to measure the intensity of single scattering photons. Based on these results, the thickness of steel plates is determined with a maximum deviation of real thickness and measured thickness of about 4 %. Monte Carlo simulation using MCNP5 code is also performed to cross check the results, which yields a maximum deviation of 2 %. These results strongly confirm the capability of this technique in analyzing gamma scattering spectra, which is a simple, effective and convenient method for determining material thickness.

Keywords

NaI(Tl) Compton scattering Thickness of material Spectrum processing technique Spectroscopy 

Notes

Acknowledgments

The authors are grateful to Vietnamese Ministry of Industry of Trade, VNUHCM-University of Science and Ho Chi Minh City University of Pedagogy for supporting this work.

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Copyright information

© Akadémiai Kiadó, Budapest, Hungary 2014

Authors and Affiliations

  • Hoang Duc Tam
    • 1
    • 2
  • Huynh Dinh Chuong
    • 3
  • Tran Thien Thanh
    • 2
  • Vo Hoang Nguyen
    • 2
  • Hoang Thi Kieu Trang
    • 2
  • Chau Van Tao
    • 2
  1. 1.Faculty of PhysicsHo Chi Minh City University of PedagogyHo Chi Minh CityVietnam
  2. 2.Faculty of Physics and Engineering PhysicsVNUHCM-University of ScienceHo Chi Minh CityVietnam
  3. 3.Nuclear Technique LaboratoryVNUHCM-University of ScienceHo Chi Minh CityVietnam

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