Characterization of Submicron Sized Josephson Junction Fabricated in a Bi2Sr2Ca2Cu3O10+δ (Bi-2223) Single Crystal Whisker
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To study the detailed characteristics of a nano-periodic Josephson junction array in a Bi2Sr2Ca2Cu3O10+δ (Bi-2223) single crystal whisker without shunted grain boundaries, we fabricate a submicron stack with an area of 0.5 μm×0.5 μm and height of approximately 200 nm using a focused ion beam (FIB) etching technique. The stack has several hundreds of elementary Josephson junctions along the c-axis. We fabricate the stack by rotation and tilt of the sample stage in the FIB. The current–voltage (I–V) characteristics give a well-defined superconducting gap (V g) and we notice suppression of the critical current in submicron junction with respect to big sized junction. We believe that the suppression of critical current in submicron junction is due to the normal resistance of the junction which belongs to the quantum resistance range.
KeywordsBi-2223 Focused ion beam Josephson junction Single crystal whisker Superconducting gap
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