Journal of Porous Materials

, Volume 20, Issue 5, pp 1111–1117 | Cite as

Enhanced light scattering in coatings templated with interfacially stabilized colloids

  • Adam F. Gross
  • Andrew P. Nowak
  • Oleg Efimov


Controlling inter-pore distances enables tuning the color or whiteness of microvoid coatings. While pore spacings have been modified in limited area inverse opal films, little work has occurred studying the feasibility of controlling pore spacings and thus the appearance of scalable, spray-on, microvoid inorganic coatings. In this work we investigated using interfacially stabilized colloidal templates to increase pore spacing and thus enhance Mie scattering in porous silica films. Coatings were fabricated by forming monodisperse colloids with or without a polyvinylpyrrolidone (PVP) interfacial stabilizing layer, dispersing them in a silica precursor solution, and spraying this suspension on a substrate. The films were cured and the colloids subsequently solution extracted at mild temperatures to create porous surfaces. Coatings made with PVP coated colloids had thicker pore walls and scattered light approximately 3× more efficiently than coatings made with bare colloids. Furthermore, a viewing angle dependent color shift was observed in the PVP colloid templated coatings. Side illumination of the samples with white light causes an orange appearance under angles of specular reflection, while a light blue appearance is observed out of these angles because of strong Mie scattering of short-wavelength radiation in both situations. Lastly, modeling based on Mie scattering confirms that it is the dominant optical effect in these coatings and explains the appearance of these coatings. The approach of using interfacially stabilized colloids to improve pore separation applies to many porous films and should be considered when increased light scattering is desired.


Mie scattering Spray coating Porous silica Colloidal templating 



The authors thank Robert E. Doty for collecting SEM images and John J. Vajo and William B. Carter for suggestions on improving this manuscript.

Supplementary material

10934_2013_9693_MOESM1_ESM.pdf (417 kb)
Supplementary material 1. (PDF 416 kb)


  1. 1.
    P. Vukusic, B. Hallam, J. Noyes, Science 315, 348 (2007)CrossRefGoogle Scholar
  2. 2.
    S. Kinoshita, S. Yoshioka, J. Miyazaki, Rep. Prog. Phys. 71, 076401 (2008)CrossRefGoogle Scholar
  3. 3.
    A. Stein, F. Li, N.R. Denny, Chem. Mater. 20, 649 (2008)CrossRefGoogle Scholar
  4. 4.
    O. Sato, S. Kuno, Z.-Z. Gu, Acc. Chem. Res. 42, 1 (2009)CrossRefGoogle Scholar
  5. 5.
    A. Tikhonov, R.D. Coalson, S.A. Asher, Phys. Rev. B 77, 235404 (2008)CrossRefGoogle Scholar
  6. 6.
    R.C. Schroden, M. Al-Daous, C.F. Blanford, A. Stein, Chem. Mater. 14, 3305 (2002)CrossRefGoogle Scholar
  7. 7.
    D.P. Gaillot, C.J. Summers, J. Appl. Phys. 100, 113118 (2006)CrossRefGoogle Scholar
  8. 8.
    J.M. Park, S.M. Hong, J. Ind. Eng. Chem. 7, 23 (2001)Google Scholar
  9. 9.
    M.S. El-Asser, S. Iqbal, J.W. Vanderhoff, in Colloid and Interface Science: Proceedings of the International Conference on Colloids and Surfaces, 50th Colloid and Surface Science Symposium, ed. by M. Kerker (Academic Press, New York, 1976–1977) pp. 381–401Google Scholar
  10. 10.
    L. Wang, Q. Yan, X.S. Zhao, J. Mater. Chem. 16, 4598 (2000)CrossRefGoogle Scholar
  11. 11.
    B.L. Drolen, C.L. Tien, J. Thermophys. Heat Transf. 1, 63 (1987)CrossRefGoogle Scholar
  12. 12.
    W.D. Ross, Ind. Eng. Chem. Prod. Res. Dev. 13, 45 (1974)CrossRefGoogle Scholar
  13. 13.
    J.S. King, D.P. Gaillot, E. Graugnard, C.J. Summers, Adv. Mater. 18, 1063 (2006)CrossRefGoogle Scholar
  14. 14.
    F. Guillemot, A. Brunet-Bruneau, E. Bourgeat-Lami, T. Gacoin, E. Barthel, J.-P. Boilot, Chem. Mater. 22, 2822 (2010)CrossRefGoogle Scholar
  15. 15.
    L.J. Fu, T. Zhang, Q. Cao, H.P. Zhang, Y.P. Wu, Electrochem. Commun. 9, 2140 (2007)CrossRefGoogle Scholar
  16. 16.
    P.S. Mudgett, L.W. Richards, Appl. Opt. 10, 1485 (1971)CrossRefGoogle Scholar
  17. 17.
  18. 18.
    H. Liu, M.Z. Yates, Langmuir 18, 6066 (2002)CrossRefGoogle Scholar
  19. 19.
    A.F. Gross, V.H. Le, B.L. Kirsch, A.E. Riley, S.H. Tolbert, Chem. Mater. 13, 3571 (2001)CrossRefGoogle Scholar
  20. 20.
    H. Xie, J. Wei, X. Zhang, J. Phys. Conf. Ser. 28, 95 (2006)Google Scholar
  21. 21.
    A. Vincent, S. Babu, E. Brinley, A. Karakoti, S. Deshpande, S. Seal, J. Phys. Chem. C 111, 8291 (2007)CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 2013

Authors and Affiliations

  1. 1.HRL LaboratoriesLLCMalibuUSA

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