Journal of Nondestructive Evaluation

, Volume 31, Issue 4, pp 383–392 | Cite as

Application of the Naive Bayes Classifier to Defect Characterization Using Active Thermography



In the paper, a method for characterization of defects using active thermography and naive Bayes classifier is presented. Experimental investigations of the test sample are conducted with the stepped heating method. Two classifiers—with the parametric and non-parametric estimation of the features density distributions—are considered. Simulations are performed for three datasets representing three phases of the heat process occurring in the investigated sample.


Active thermography Nondestructive evaluation Naive Bayes classification Defect characterization 


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Copyright information

© Springer Science+Business Media, LLC 2012

Authors and Affiliations

  1. 1.Department of Electrical EngineeringCzestochowa University of TechnologyCzestochowaPoland

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