Abstract
Crystal-superfluid interface of 4He in aerogel was shown to advance smoothly in a high temperature creep growth region above 0.6 K. In this report, we focused on the shape of the growing interface in the region and attempted to analyze the roughness of interfaces. The growth of rough interfaces is very common in nature and is known to often follow a scaling law; roughness usually increases with time and saturates in the later stage. We measured the roughness w(t) defined as the standard deviation of the interface height as a function of time t. It was found that w(t) in 98 % porosity aerogel initially increased with t and decreased after a particular time in the later stage. The abrupt reduction of roughness in the end of crystallization is unusual if it is intrinsic in the crystallization in aerogel.
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Acknowledgements
We would like to thank J. Pollanen and W.P. Halperin for providing us with aerogel samples supported by NSF grant number DMR-0703656. This study was supported in part by the GCOE at Tokyo Tech. “Nanoscience and Quantum Physics Project”, a Grant-in-Aid for Scientific Research (B) (Grant No. 21340095) from the Ministry of Education, Culture, Sports, Science and Technology of Japan and by a “Ground-based Research Announcement for Space Utilization” promoted by JAXA.
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Ochi, A., Matsuda, H., Isozaki, R. et al. Fluctuating Surfaces of Growing 4He Crystals in Aerogel. J Low Temp Phys 175, 126–132 (2014). https://doi.org/10.1007/s10909-013-0974-7
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DOI: https://doi.org/10.1007/s10909-013-0974-7