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Development of a detector-based absolute spectral power responsivity scale in the spectral range of 300–1600 nm

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Abstract

The radiometry laboratory at the National Institute of Standards (NIS) has taken in his shoulder to develop and improve the spectral responsivity facilities to get high precision and more reliable optical detectors measurements. During the last few years, the calibration of the detectors was refined as well as the reliability of spectral responsivity results, especially in the critical ultra-violet and infrared range of the spectrum. This setup was constructed using a lamp-monochromator-based setup accompanied by a silicon trap detector and an Indium Gallium Arsenide (InGaAs) detector to extend the scale to the infrared (IR) spectral region. Both detectors are traceable and shown to be spatially uniform, linear, stable, and capable of disseminating an absolute spectral responsivity scale. The uncertainty contribution of the spectral responsivity for a silicon-based detector is less than 1–1.9% for the spectral range 300–1100 nm, and about 2–3.8 % (k = 2) for InGaAs-based detector in the wavelength range 800–1600 nm. Additionally, this paper gives a comprehensive overview of’ NIS’s spectral responsivity facilities, which are now fully automated and controlled by LabVIEW.

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Acknowledgements

The authors would like to express their gratitude toward the NIS members for their kind co-operation and encouragement, which help me complete this research. We want to express special appreciation and thanks to these persons for giving us such attention and time during the study.

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Authors and Affiliations

  1. Division of Photometry and Radiometry, National Institute of Standards (NIS), President Sadat St., 136, Al-Haram, Giza, Egypt

    Abdallah M. Karmalawi & Alaaeldin A. Abdelmageed

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  1. Abdallah M. Karmalawi
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  2. Alaaeldin A. Abdelmageed
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Correspondence to Abdallah M. Karmalawi.

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Karmalawi, A.M., Abdelmageed, A.A. Development of a detector-based absolute spectral power responsivity scale in the spectral range of 300–1600 nm. J Mater Sci: Mater Electron 32, 5215–5221 (2021). https://doi.org/10.1007/s10854-021-05253-6

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  • DOI: https://doi.org/10.1007/s10854-021-05253-6

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