Abstract
The coexistence of Al and Si has a significant impact on the electromagnetic shielding effectiveness (SE) of Ti3(Al, Si)C2 ceramics and the total SE (SET) peaked when mol(Al): mol(Si) = 1:1. Ti3(Al1/2Si1/2)C2 ceramic exhibit high SET around 47 dB and excellent frequency-stability within X-band frequency. The high SET originates from both high reflection and absorption. High reflection is related to the larger amounts of defects, while high absorption was ascribed to the higher Ohimic loss and coarse microstructure which is beneficial for multiple reflections. Results indicate that Ti3(Al1/2Si1/2)C2 ceramic could be considered as promising structural electromagnetic shielding materials.
Similar content being viewed by others
References
W.L. Song, M.S. Cao, Z.L. Hou, J. Yuan, X.Y. Fang, Scripta Mater. 61, 201–204 (2009)
D. Yan, H. Pang, B. Li, R. Vajtai, L. Xu, P. Ren, J. Wang, Z. Li, Adv. Func. Mater. 25, 559–566 (2015)
P. Kumar, F. Shahzad, S. Yu, S.M. Hong, Y.H. Kim, C.M. Koo, Carbon 94, 494–500 (2015)
M. Cao, X. Wang, W. Cao, J. Yuan, J. Mater. Chem. C 3, 6589–6599 (2015)
N. Yousefi, X. Sun, X. Lin, X. Shen, J. Jia, B. Zhang, B. Tang, M. Chan, J.K. Kim, Adv. Mater. 26, 5480–5487 (2014)
Y. Qing, Q. Wen, F. Luo, W. Zhou, D. Zhu, J. Mater. Chem. C 4, 371–375 (2016)
Y. Qing, Q. Wen, F. Luo, W. Zhou, J. Mater. Chem. C 4, 4853–4862 (2016)
P. Saini, M. Arora, G. Gupta, B.K. Gupta, V.N. Singh, V. Choudhary, Nanoscale 5, 4330–4336 (2013)
D.X. Yan, P.G. Ren, H. Pang, Q. Fu, M.B. Yang, Z.M. Li, J. Mater. Chem. 22, 18772–18774 (2012)
J. Joo, A.J. Epstein, Appl. Phys. Lett. 65, 2278–2280 (1994)
S. Shi, L. Zhang, J. Li, Appl. Phys. Lett. 93, 172903 (2008)
J. Wang, Y. Zhou, Annu. Rev. Mater. Res. 39, 415–443 (2009)
Y. Tan, H. Luo, X. Zhou, S. Peng, H. Zhang, Sci. Rep. 8, 7935 (2018)
M.H. Al-Saleh, W.H. Saadeh, U. Sundararaj, Carbon 60, 146–156 (2013)
Y.C. Zhou, J.X. Chen, J.Y. Wang, Acta Mater. 54, 1317–1322 (2006)
X. Yin, M. Li, J. Xu, J. Zhang, Y. Zhou, Mater. Res. Bull. 44, 1379–1384 (2009)
Y. Tan, H. Luo, H. Zhang, X. Zhou, S. Peng, Scripta Mater. 134, 47–51 (2017)
N. Dong, L. Chen, X. Yin, X. Ma, X. Sun, L. Cheng, L. Zhang, Ceram. Int. 42, 9448–9454 (2016)
Y. Mu, W. Zhou, F. Wan, D. Ding, Y. Hu, F. Luo, Compos. A 77, 195–203 (2015)
X. Yin, L. Kong, L. Zhang, L. Cheng, N. Travitzky, P. Greil, Int. Mater. Rev. 59, 326–355 (2014)
Y. Qing, Y. Mu, Y. Zhou, F. Luo, D. Zhu, W. Zhou, J. Eur. Ceram. Soc. 34, 2229–2237 (2014)
X. Li, L. Zhang, X. Yin, J. Eur. Ceram. Soc. 33, 647–651 (2013)
D. Ding, Y. Shi, Z. Wu, W. Zhou, F. Luo, J. Chen, Carbon 60, 552–555 (2013)
X. Li, L. Zhang, X. Yin, L. Feng, Q. Li, Scripta Mater. 63, 657–660 (2010)
S. Shi, L. Zhang, J. Li, J. Appl. Phys. 103, 124103 (2008)
Z. Wang, R. Wei, X. Liu, A.C.S. Appl, Mater. Interfaces 9, 22408–22419 (2017)
Acknowledgements
This work was supported by the National Natural Science Foundation of China (Grant Nos. 91326102 and 51532009), and the Science and Technology Development Foundation of China Academy of Engineering Physics (Grant No. 2013A0301012). H. B. Zhang is grateful to the foundation by the Recruitment Program of Global Youth Experts and the Youth Hundred Talents Project of Sichuan Province.
Author information
Authors and Affiliations
Corresponding author
Additional information
Publisher's Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
About this article
Cite this article
Tan, Y., Chen, C., Luo, H. et al. Large electromagnetic interference shielding effectiveness in Ti3(Al, Si)C2 system. J Mater Sci: Mater Electron 30, 11011–11016 (2019). https://doi.org/10.1007/s10854-019-01442-6
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10854-019-01442-6