Effect of substrate temperature on the optical properties of CaBi4Ti4O15 thin films deposited by pulsed laser ablation
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Thin films of CaBi4Ti4O15 (CBTi) were deposited at different substrate temperatures (550–700 °C) using pulsed laser ablation technique. Structural, morphological and linear optical properties of the same were investigated. The CBTi thin films crystallize above 550 °C and forms single phase is confirmed by XRD and Raman spectroscopy. The lattice strain induced during deposition, controls the unit cell volume, grain size and crystallite size. The refractive index, real and imaginary parts of optical dielectric constant and optical band gap were extracted from transmission spectra (190–2500 nm). Tauc’s plot confirmed the direct band gap nature ranging from 3.4 to 3.6 eV. The study on CBTi thin films and their optical properties opens up a new window for optical applications.
KeywordsBismuth Deposition Temperature Optical Conductivity Full Width Half Maximum Pulse Laser Ablation
The authors acknowledge the facilities provided by the School of Physics (SoP), School of chemistry (SoC) and Center for Nanotechnology (DST) of University of Hyderabad for this work. We also acknowledge DRDO through ACRHEM for financial support.
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