Broadband near-infrared absorption enhancement in Si substrate via random distributed Ag nanoparticles



A broadband near-infrared (NIR) absorption from 1200 to 2500 nm in Si substrate is investigated by Ag film deposition and subsequent thermal annealing. Under thermal annealing, Ag films can crack and shrink into Ag nanoparticles (NPs). Annealing temperature greatly affects the size, distribution status and morphology of Ag NPs, resulting in different NIR absorption. The influence of the size and distribution of Ag NPs on NIR absorption originated from localized surface plasmon resonance (LSPR) is theoretically simulated by a finite difference time domain method. The band width of LSPR belongs to different type Ag NPs are discussed.


Localize Surface Plasmon Resonance Absorption Enhancement Finite Difference Time Domain Method Absorption Peak Position Subsequent Thermal Annealing 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.



Project supported by the National Natural Science Foundation of China (Nos. 61306125 & U1435210), the Science and Technology Innovation Project (Y3CX1SS143) of CIOMP, the Science and Technology Innovation Foundation of CAS (CXJJ-15Q071), the Science and Technology Innovation Project of Jilin Province (Nos. Y3293UM130 & 20130522147JH & 20140101176JC).


  1. 1.
    Y.J. Su, S.B. Li, G.D. Zhao, Z.M. Wu, Y.J. Yang, W. Li, Y.D. Jiang, J. Mater. Sci.: Mater. Electron. 23, 1558 (2012)Google Scholar
  2. 2.
    J. Jiang, S.B. Li, Y.D. Jiang, Z.M. Wu, Z.F. Xiao, Y.J. Su, J. Mater. Sci.: Mater. Electron. 24, 463 (2013)Google Scholar
  3. 3.
    C. Wang, J. Jiang, C.G. Zhang, Y.D. Jiang, S.B. Li, Z.M. Wu, J. Mater. Sci.: Mater. Electron. 25, 1542 (2014)Google Scholar
  4. 4.
    J. Yang, F.F. Luo, T.S. Kao, X. Li, G.W. Ho, J.H. Teng, X.G. Luo, M.H. Hong, Light Sci. Appl. 3, e185 (2014)CrossRefGoogle Scholar
  5. 5.
    B. Fazio, P. Artoni, M.A. Iatì, C. D’Andrea, M.J.L. Faro, S. Delsorbo, S. Pirotta, P.G. Gucciardi, P. Musumeci, C.S. Vasi, R. Saija, M. Galli, F. Priolo, A. Irrera, Light Sci. Appl. 5, e16062 (2016)CrossRefGoogle Scholar
  6. 6.
    T. Zhang, P. Zhang, S.B. Li, W. Li, Z.M. Wu, Y.D. Jiang, Nanoscale Res. Lett. 8, 351 (2013)Google Scholar
  7. 7.
    M.W. Knight, H. Sobhani, P. Nordlander, N.J. Halas, Science 332, 702 (2011)CrossRefGoogle Scholar
  8. 8.
    K.T. Lin, H.L. Chen, Y.S. Lai, C.C. Yu, Nat. Commun. 5, 3288 (2014)Google Scholar
  9. 9.
    M.A. Nazirzadeh, F.B. Atar, B.B. Turgut, A.K. Okyay, Sci. Rep. 4, 7103 (2014)CrossRefGoogle Scholar
  10. 10.
    W. Li, J. Valentine, Nano Lett. 14, 3510 (2014)CrossRefGoogle Scholar
  11. 11.
    A. Sobhani, M.W. Knight, Y.M. Wang, B. Zheng, N.S. King, L.V. Brown, Z.Y. Fang, P. Nordlander, N.J. Halas, Nat. Commun. 4, 1643 (2013)CrossRefGoogle Scholar
  12. 12.
    P. Zhang, S.B. Li, C.H. Liu, X.B. Wei, Z.M. Wu, Y.D. Jiang, Z. Chen, Nanoscale Res. Lett. 9, 519 (2014)CrossRefGoogle Scholar
  13. 13.
    K. Okamoto, I. Niki, A. Shvartser, Y. Narukawa, T. Mukai, A. Scherer, Nat. Mater. 3, 601 (2004)CrossRefGoogle Scholar
  14. 14.
    K.Y. Yang, K.C. Choi, C.W. Ahn, Opt. Express 17, 11495 (2009)CrossRefGoogle Scholar
  15. 15.
    Y. Wang, Y.P. Liu, H.L. Liang, Z.X. Mei, X.L. Du, Phys. Chem. Chem. Phys. 15, 2345 (2013)CrossRefGoogle Scholar
  16. 16.
    C.L. Tan, S.J. Jang, Y.M. Song, K. Alameh, Y.T. Lee, Nanoscale Res. Lett. 9, 181 (2014)CrossRefGoogle Scholar
  17. 17.
    Z.M. Saleh, H. Nasser, E. Özkol, M. Günöven, B. Altuntas, A. Bek, R. Turan, Plasmonics 9, 357 (2014)CrossRefGoogle Scholar
  18. 18.
    Y.L. Wang, S.Y. Liu, Y. Wang, G.J. Feng, J.T. Zhu, L. Zhao, Mater. Lett. 63, 2718 (2009)CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 2016

Authors and Affiliations

  1. 1.Key Laboratory of Optical System Advanced Manufacturing Technology, Changchun Institute of Optics, Fine Mechanics and PhysicsChinese Academy of SciencesChangchunChina
  2. 2.University of the Chinese Academy of SciencesBeijingChina

Personalised recommendations