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Influence of protective atmosphere on the solderability and reliability of OSP-based solder joints

  • Yeqing Tao
  • Dongyan Ding
  • Ting Li
  • Jason Guo
  • Yunhong Yu
Article

Abstract

Electronic assembly technology is in the transition from traditional tin–lead to lead-free age. In comparison with Sn–Pb solders, high melting point and poor wettability of the lead-free solders lead to great challenge in many aspects. It is accepted that inert nitrogen atmosphere can improve the wettability and reliability of solder joints. But few systemic investigations have been performed on confirming the specific atmosphere requirement and optimizing the oxygen concentration in nitrogen. The focus of this study is to investigate the effect of reflow atmosphere on solder joint solderability and reliability for SAC305 lead-free solder. By in situ observations of the wetting behavior during reflow with SMT microscope, we developed a novel method to evaluate the wettability of solder joints. The spreading area and the tin climbing height of 0805 type capacitor were measured for different reflow atmospheres. Experimental results showed that nitrogen atmosphere could obviously improve the solder joint quality and the solder joint fabricated in 100 ppm O2/N2 exhibited the best wetting performance. Visual inspection through optical microscope and microstructural characterization of the solder joints after both reflow process and environmental tests were also carried out. It indicated that thermal cycle tests had serious degradation effect on the reliability of components fabricated in all of the atmospheres.

Keywords

Solder Joint Spreading Area Protective Atmosphere Liquid Solder Organic Solderability Preservative 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgments

This work was supported by Air Liquide China and China National Major Scientific Instruments Equipment Development Project (No. 2012YQ15000105). We would like to thank the contribution from SEM lab at Instrumental Analysis Center of Shanghai Jiao Tong University.

Compliance with ethical standards

Conflict of interest

The authors have declared that no conflict of interest exists.

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Copyright information

© Springer Science+Business Media New York 2016

Authors and Affiliations

  • Yeqing Tao
    • 1
  • Dongyan Ding
    • 1
  • Ting Li
    • 1
  • Jason Guo
    • 2
  • Yunhong Yu
    • 2
  1. 1.Institute of Electronic Materials and Technology, School of Materials Science and EngineeringShanghai Jiao Tong UniversityShanghaiChina
  2. 2.Air Liquide ChinaShanghaiChina

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