Property optimization of nano TiO2-based composite glass ceramics for energy-storage applications
- 184 Downloads
In this search, the nanocomposite of the rutile nano TiO2 and alkali-free glass (CaO–MgO–Al2O3–SiO2) were successfully produced by the method of sol–gel, which were sintered at 1200 °C for 2 h. The dielectric properties of the composites were studied. The permittivity of the composite with 15 % alkali-free glass addition is 114, while the breakdown voltage is 52.2 kV/mm and the energy density reaches 1.08 J/cm3 with low loss (<0.01), which is 1.4 times higher than that of pure TiO2 (0.76 J/cm3).
KeywordsTiO2 Rutile Pure TiO2 Breakdown Strength Energy Storage Density
This work is supported by the State Key Program of National Natural Science of China (Grant Nos. 50932002 and 51172035).
- 6.W. Huebner, S.C. Zhang, High energy density dielectrics for symmetric blumleins. In: Proceedings of the 12th IEEE International Symposium on Applications of Ferroelectrics, vol. 2 (2000), pp. 833–836Google Scholar
- 9.R. Macklin, Electrostatic Energy Storage. NASA STI/Recon Technical Report N, 77 (1976), p. 24598Google Scholar
- 10.W. Huebner, S.C. Zhang, B. Gilmore, M.L. Krogh, B.C. Schultz, R.C. Pate et al., High breakdown strength, multilayer ceramics for compact pulsed power applications. In: 12th IEEE International Pulsed Power Conference, Digest of Technical Papers, vol. 2 (1999), pp. 1242–1245Google Scholar
- 11.Y. Ye, S.C. Zhang, F. Dogan, E. Schamiloglu, J. Gaudet, P. Castro et al., Influence of nanocrystalline grain size on the breakdown strength of ceramic dielectrics. In: Ppc-2003: 14th IEEE International Pulsed Power Conference, vols. 1, 2, Digest of Technical Papers, vols. 1, 2 (2003), pp. 719–722Google Scholar
- 18.R.D. Weir et al. Electrical-Energy-Storage Unit (EESU) Utilizing Ceramic and Integrated-Circuit Technologies for Replacement of Electrochemical Batteries. US7033406 April 25 (2006)Google Scholar
- 21.G. Mazzanti, G.C. Montanari, F. Peruzzotti, A. Zaopo, Some remarks regarding the test cells used for electric strength measurement. In: Electrical Insulation, 1996, Conference Record of the 1996 IEEE International Symposium, Montreal, Canada, vol. 2 (1996), pp. 474–477Google Scholar