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Effect of annealing at oxygen partial pressure on the conductivity of Ni0.5Mn2.5O4 oxides

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Abstract

This paper presents a study of the electrical properties of nickel manganite Ni0.5Mn2.5O4−x as a function of annealing at oxygen partial pressure. The crystalline phase of manganite ceramics during annealing at oxygen partial pressure was investigated using X-ray diffraction; the predominant phase was tetragonal spinel. The electrical properties were analyzed by measuring resistance–temperature characteristics. The activation energy for electron hopping, determined using the slope of the ln ρ–1/T plots, was higher for samples annealed at lower oxygen partial pressure. The Mn4+/Mn3+ ratio, obtained through differential thermal analysis, increased with an increase in the oxygen partial pressure during annealing. The relationship between resistivity and the Mn4+/Mn3+ ratio during annealing at oxygen partial pressure was investigated.

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Acknowledgments

Financial support for this research, provided by the National Science Council, Taiwan, ROC, under Grant No. NSC 98-2221-E-036-012, is gratefully acknowledged.

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Authors and Affiliations

  1. Department of Materials Engineering, Tatung University, 40 Chungshan N. Road, 3rd Sec., Taipei, 104, Taiwan

    Chia-Jung Hu, Yi Hu, C.-Y. Nien & Tung-Cheng Liu

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  1. Chia-Jung Hu
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  2. Yi Hu
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  3. C.-Y. Nien
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  4. Tung-Cheng Liu
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Correspondence to Chia-Jung Hu.

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Hu, CJ., Hu, Y., Nien, CY. et al. Effect of annealing at oxygen partial pressure on the conductivity of Ni0.5Mn2.5O4 oxides. J Mater Sci: Mater Electron 26, 4172–4177 (2015). https://doi.org/10.1007/s10854-015-2962-y

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