Advertisement

Structural, optical and magnetic properties of Ni-doped CdS thin films prepared by CBD

  • R. Premarani
  • J. Jebaraj Devadasan
  • S. Saravanakumar
  • R. Chandramohan
  • T. Mahalingam
Article

Abstract

Room-temperature ferromagnetic behavior of undoped cadmium sulphide (CdS) and Ni-doped CdS thinfilms prepared by chemical bath deposition technique is reported. The crystallite sizes of the thinfilms have been characterized by X-ray diffraction pattern. The particle sizes increase from 11 to 40 nm with the increase of Ni content in the CdS thinfilms. scanning electron microscope results indicated that CdS thinfilms is made up of aggregate of spherical-like particles. The composition was estimated by Energy dispersive analysis of X-ray and reported. Spectroscopic studies revealed considerable improvement in transmission and the band gap of the films decreased from 2.62 to 2.28 eV with addition of Ni dopant that is associated with variation in crystallite sizes in the nano regime. Magnetization measurements indicate that the Ni doped CdS thinfilms exhibited ferromagnetism and the saturation magnetization decreases with the increase of crystal sizes in the Ni doped CdS nano thinfilms. This finding in CdS thinfilms should be focus of the future electronic and spintronics devices.

Keywords

Room Temperature Ferromagnetism Cadmium Sulphide Chemical Spray Pyrolysis Chemical Bath Deposition Technique 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgments

The author has gratefully acknowledged the UGC- No. F.41-913/2012 (SR), India for providing financial support to carry out this work.

References

  1. 1.
    P. Zhang, P.S. Kim, T.K. Sham, J. Appl. Phys. 91, 6038 (2002)CrossRefGoogle Scholar
  2. 2.
    Y. Li et al., J. Mater. Chem. 15, 917 (2005)Google Scholar
  3. 3.
    H. Liang, T.E. Angelini, P.V. Braun, G.C.L. Wong, J. Am. Chem. Soc. 126, 14157 (2006)CrossRefGoogle Scholar
  4. 4.
    H. Pan, J.B. Yi, L. Shen, R.Q. Wu, J.H. Yang, Y.P. Feng, J. Ding, L.H. Van, J.H. Yin, Phys. Rev. Lett. 99, 127201 (2009)CrossRefGoogle Scholar
  5. 5.
    Brus Le, Appl. Phys. Lett. 53, 465 (1991)Google Scholar
  6. 6.
    R. Tenne, VM. Nabutovsky, E. Lifshitz, AF. Francis. Solid State Commun. 82, 651 (1992)CrossRefGoogle Scholar
  7. 7.
    I.O. Oladeji, L. Chow, Thin Solid Films 474, 77 (2005)CrossRefGoogle Scholar
  8. 8.
    N.V. Hullavarad, S.S. Hullavarad, P.C. Karulkar, J. Nano Sci. Nano Technol. 8, 3272 (2008)CrossRefGoogle Scholar
  9. 9.
    K. Gurumurugan, D. Mangalraj, Sa. K. Naratanadass. J. Cryst. Growth 147, 355 (1995)CrossRefGoogle Scholar
  10. 10.
    R.K. Gupta, K. Ghosh, R. Patel, S.R. Mishra, P.K. Kahol, Mater. Lett. 62, 4103 (2008)CrossRefGoogle Scholar
  11. 11.
    R. Ferro, J.A. Rodriguez, Thin Solid Films 347, 295 (1999)CrossRefGoogle Scholar
  12. 12.
    A.J. Varkey, A.F. Fort, Thin Solid Films 239, 211 (1994)CrossRefGoogle Scholar
  13. 13.
    E. Cetinorgu, C. Gumus, R. Esen, Thin Solid Films 2, 1688 (2006)CrossRefGoogle Scholar
  14. 14.
    A.L. Dawer, P.K. Shishodia, J. Chouhan, G. Kumar, A. Mathur, Mater. Sci. Lett. 9, 547 (1990)CrossRefGoogle Scholar
  15. 15.
    P. Sharma, V. Sharma, S.C. Katyal, Cholcogenide Lett. 3, 73 (2006)Google Scholar
  16. 16.
    F. Tephan, N. Ozer, Sol. Energy Mater. Sol. Cells 30, 353 (1993)CrossRefGoogle Scholar
  17. 17.
    A. Ashour, N. El-Kdry, S.A. Mahmood, Thin Solid Films 269, 117 (1995)CrossRefGoogle Scholar
  18. 18.
    R.J. Heath, J.J. Shiang, Chem. Soc. Rev. 27, 65 (1998)CrossRefGoogle Scholar
  19. 19.
    M. Thambidurai, N. Muthukumarasamy, S. Agilan, N. Murugan, S. Vasantha, R. Balasundaraprabhu, T.S. Senthil, J. Mater. Sci. 45, 3254 (2010)CrossRefGoogle Scholar
  20. 20.
    X.C. Liu, E.W. Shi, Z.Z. Chen, H.W. Zhang, B. Xiao, L.X. Song, Appl. Phys. Lett. 88, 252503 (2006)CrossRefGoogle Scholar
  21. 21.
    D. Chakraborti, S. Ramachandran, Trichy G. Narayan and JT. Prater. J. Appl. Phys. 101, 053918 (2007)CrossRefGoogle Scholar
  22. 22.
    M. Elango, K. Gopalakrishnan, S. Vairam, M. Tamilselvam, J. Alloys Compd. 538, 48 (2012)CrossRefGoogle Scholar
  23. 23.
    P. Venkatesu, K. Ravichandran, Adv. Mat. Lett. 4, 202 (2013)Google Scholar
  24. 24.
    A. Rmili, F. Ouachtar, A. Bouaoud, A. Louardi, T. Chtouki, B. Elidrissi, H. Erguig, J. Alloys Compd. 557, 53 (2013)CrossRefGoogle Scholar
  25. 25.
    S. Kumar, S. Kumar, S. Jain, N.K. Verma, Appl. Nanosci 2, 127–131 (2012)CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 2014

Authors and Affiliations

  • R. Premarani
    • 1
  • J. Jebaraj Devadasan
    • 2
  • S. Saravanakumar
    • 3
  • R. Chandramohan
    • 3
  • T. Mahalingam
    • 4
  1. 1.Department of PhysicsArumugam Pillai Seethai Ammal CollegeThiruppatturIndia
  2. 2.Research Department of PhysicsPope’s CollegeSawyerpuramIndia
  3. 3.PG and Research Department of PhysicsSree Sevugan Annamalai CollegeDevakottaiIndia
  4. 4.Department of Electrical and Computer EngineeringAjou UniversitySuwonSouth Korea

Personalised recommendations