Abstract
The mechanical activation technique has been used to synthesize nanocrystalline multiferroic materials as it creates large density of crystal defects in these materials leading to novel magnetic properties of the nanostructured materials. In the present work, an attempt has been made to prepare nanocrystalline bismuth ferrite by mechanical activation process using high-energy planetary ball mill followed by sintering at 830 °C for 2 h. The milled powder was characterized using X-ray diffraction, scanning and transmission electron microscope, which revealed the formation of Bi3−δFe5O12 instead of BiFeO3. A giant dielectric peak has been observed at around the Curie temperature indicating magneto dielectric coupling which is a primary requisite for potential applications and transition temperature increases with the milling duration. Suppression in ferroelectric nature and enhancement in magnetic properties has been observed with the milling duration.
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L.B. Kong, T.S. Zhang, J. Ma, F. Boey, Prog. Mater. Sci. 53, 207–322 (2008)
B. Antic, A. Kremenovic, N. Jovic, M.B. Pavlovic, C. Jovalekic et al., J. Appl. Phys. 111, 074309 (2012)
I. Sosnowska, T. Paterlin-Neumaier, E. Steichele, J. Phys. C 15, 4835 (1982)
P.K. Jha, P.A. Jha, G. Srivastava, A.K. Jha, R.K. Kotnala, R.K. Dwivedi, J. Magn. Magn. Mater. 349, 95–99 (2014)
V. Kuzmiak, S. Eyderman, M. Vanwolleghem, Phys. Rev. B 86, 045403 (2012)
S. Wittekoek, T.J.A. Popma, J.M. Robertson, P.F. Bongers, Phys. Rev. B 12, 2777 (1975)
Y.J. Wu, Y. Gao, X.M. Chen, Appl. Phys. Lett. 91, 092912 (2007)
Y.J. Wu, C. Yu, X.M. Chen, J. Li, Appl. Phys. Lett. 100, 052902 (2012)
C. Dong, J. Appl. Crystallogr. 32, 838 (1999)
P. Scherrer, Nachr. Akad. Wiss. Gott. Philol. Hist. Kl. 2, 98–100 (1918)
M.V. Ramana, M.P. Reddy, N.R. Reddy, K.V. Siva Kumar, V.R.K. Murthy, B.S. Murty, J. Nanomater. 783043, 8 pp (2010)
S.K.S. Parashar, R.N.P. Choudhary, B.S. Murty, J. Appl. Phys. 94(9), 6091–6096 (2003)
C. Scott, M. Kaliszewski, C. Greskovich, L. Levinson, J. Am. Ceram. Soc. 85(5), 1275–1280 (2002)
D.B. Williams, Tranmission Electron Microscopy II: Diffraction (Plenum press, New York, 1996)
L. Luo, Y. Kang, J.C. Yang, G. Zhou, J. Appl. Phys. 111, 083533 (2012)
A.L. Patterson, Phys. Rev. B 56, 978 (1939)
J.I. Langford, A.J.C. Wilson, J. Appl. Crystallogr. 11, 102–113 (1978)
R.C. Buchanan, Ceramic Materials for Electronics: Processing, Properties and Applications (Marcel Dekker Inc., New York, 1991)
R.K. Dwivedi, D. Kumar, O. Prakash, J. Phys. D Appl. Phys. 33(1), 88 (2000)
Y. Noguchi, M. Miyayama, Appl. Phys. Lett. 78, 1903–1905 (2001)
A. Chen, Y. Zhi, L.E. Cross, Phys. Rev. B 62, 228–236 (2000)
P.A. Jha, A.K. Jha, J. Mater. Sci. Mater. Electron. 24, 1511–1518 (2013)
A.K. Jonscher, Dielectric Relaxation in Solids (Chelsea Dielectrics Press, London, 1983)
B. Vertruyen, R. Cloots, J.S. Abell, T.J. Jackson, R.C. Da Silva, E. Popova, N. Keller, Phys. Rev. B 78, 094429 (2008)
S.O. Pillai, Solid State Physics (New Age International (P) Ltd, Delhi, 2005)
D.L. Fox, D.R. Tilley, J.F. Scott, M.H.J. Guggenheim Bell, Phys. Rev. B 21(7), 2926 (1980)
D.R. Lide, CRC Handbook of Chemistry and Physics, 87th edn. (CRC, Boca Raton, 2007)
R.K. Dwivedi, D. Kumar, O. Prakash, J. Mater. Sci. 36, 3641–3648 (2001)
C. Kittel, Introduction to Solid State Physics (Wiley, New York, 2003)
K.F. Wang, J.-M. Liu, Z.F. Ren, Adv. Phys. 58(4), 321–448 (2009)
Acknowledgments
Authors are thankful to Dr. R. K. Kotnala (NPL, Delhi) and Dr. A. K. Jha (AIACTR, Delhi) for providing experimental facilities. This research work is supported by Defence Research and Development Organisation (DRDO), India (Project No. ERIPR/ER/0803744/M/01/1246).
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Jha, P.K., Jha, P.A., Kumar, P. et al. Defect induced weak ferroelectricity and magnetism in cubic off-stoichiometric nano bismuth iron garnet: effect of milling duration. J Mater Sci: Mater Electron 25, 664–672 (2014). https://doi.org/10.1007/s10854-013-1628-x
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DOI: https://doi.org/10.1007/s10854-013-1628-x