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Effects of sintering temperature on dielectric and piezoelectric properties of KNN-LS-BF-0.4mol%CuO lead-free piezoelectric ceramics

  • Hua Wang
  • Xia Zhai
  • Jiwen Xu
  • Changlai Yuan
  • Ling Yang
Article

Abstract

KNN-LS-BF-0.4mol%CuO piezoelectric ceramics were prepared by the traditional sintering method. The effects of sintering temperature on the dielectric and piezoelectric properties of KNN-LS-BF-0.4mol%CuO ceramics were studied. The results reveal that the sintering temperature has significant influence on the microstructure and the properties of KNN-LS-BF-0.4mol%CuO ceramics. With the increase of sintering temperature from 1,040 to 1,080 °C, the grains become more homogeneous and more tight-arrangement, resulting in the higher relative density as well as the best dielectric and piezoelectric properties. However, the properties of the samples would be deteriorated as they are sintered over 1,080 °C.

Keywords

Sinter Temperature Tetragonal Phase Piezoelectric Property Sb2O3 Piezoelectric Ceramic 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgments

The authors wish to acknowledge the financial support of the Guangxi Nature Science Foundations, Grant No. 2010GXNSFD013007.

References

  1. 1.
    B. Jaffe, W.R. Cook, H. Jaffe, Piezoelectric Ceramics (Academic Press, New York, 1971)Google Scholar
  2. 2.
    P. Jarupoom, K. Pengpat, N. Pisitpipathsin, S. Eitssayeam, U. Inatha, G. Rujijanagul, T. Tunkasiri, Curr. Appl. Phys. 8, 253 (2008)CrossRefGoogle Scholar
  3. 3.
    W. Meng, R. Zuo, S. Su, X. Wang, L. Li, J. Mater. Sci. Mater. Electron. 22, 1841 (2011)CrossRefGoogle Scholar
  4. 4.
    Y. Cui, X. Liu, M. Jiang, Y. Hu, Q. Su, H. Wang, J. Mater. Sci. Mater. Electron. 23, 1342 (2012)CrossRefGoogle Scholar
  5. 5.
    R.Z. Zuo, C. Ye, X.S. Fang, Phys. Chem. Solids. 69, 230 (2008)CrossRefGoogle Scholar
  6. 6.
    H.Y. Park, C.W. Ahn, K.H. Cho, S. Nahm, H.G. Lee, H.W. Kang, D.H. Kim, K.S. Park, J. Am. Ceram. Soc. 90, 4066 (2007)Google Scholar
  7. 7.
    G.Z. Zang, L.B. Li, X.J. Yi, J. Du, Y. Li, J. Mater. Sci. Mater. Electron 23, 977 (2012)CrossRefGoogle Scholar
  8. 8.
    L. Egerton, D.M. Dillon, J. Am. Ceram. Soc. 42, 438 (1959)CrossRefGoogle Scholar
  9. 9.
    M.D. Maeder, D. Damjanovic, N. Setter, J. Electroceram. 13, 385 (2004)CrossRefGoogle Scholar
  10. 10.
    X. Pang, J. Qiu, K. Zhu, J. Du, J. Mater. Sci. Mater. Electron. 23, 1083 (2012)CrossRefGoogle Scholar
  11. 11.
    B. Shao, J. Qiu, K. Zhu, X. Pang, Q. Meng, J. Mater. Sci. Mater. Electron. 23, 846 (2012)CrossRefGoogle Scholar
  12. 12.
    D. Lin, K.W. Kwok, J. Mater. Sci. Mater. Electron. 23, 501 (2012)CrossRefGoogle Scholar
  13. 13.
    Y.M. Li, Z.Y. Shen, L. Jiang, F. Wu, Z.M. Wang, Y. Hong, R.H. Liao, J. Mater. Sci. Mater. Electron. 22, 1409 (2011)CrossRefGoogle Scholar
  14. 14.
    M.H. Jiang, X.Y. Liu, G.H. Chen, Scripta Mater. 60, 909 (2009)CrossRefGoogle Scholar
  15. 15.
    S.H. Park, C.W. Ahn, S. Nahm, J.S. Song, Jpn. J. Appl. Phys. 43, L1072 (2004)CrossRefGoogle Scholar
  16. 16.
    C.W. Ahn, H.C. Song, S. Nahm, S.H. Park, K. Uchino, S. Priya, H.G. Lee, N.K. Kang, Jpn. J. Appl. Phys. 44, L1361 (2005)CrossRefGoogle Scholar
  17. 17.
    M. Matsubara, T. Yamaguchi, K. Kikuta, S. Hirano, Jpn. J. Appl. Phys. 43, 7159 (2004)CrossRefGoogle Scholar
  18. 18.
    M. Matsubara, K. Kikuta, S. Hirano, J. Appl. Phys. 97, 114105 (2005)CrossRefGoogle Scholar
  19. 19.
    I.T. Seo, H.Y. Park, N.V. Dung, M.K. Choi, S. Nahm, H.G. Lee, B.H. Choi, IEEE Trans. Ultrason. Ferroelectr. Freq. Control. 56, 2337 (2009)Google Scholar
  20. 20.
    M. Matsubara, K. Kikuta, S. Hirano, J. Appl. Phys. 97, 114105 (2005)CrossRefGoogle Scholar
  21. 21.
    M. Matsubara, T. Yamaguchi, W. Sakamoto, K. Kikuta, T. Yogo, S. Hirano, J. Am. Ceram. Soc. 88, 1190 (2005)CrossRefGoogle Scholar
  22. 22.
    H. Wang, R. Zuo, L. Wang, J. Fang, X. Wang, L. Li, J. Mater. Sci. Mater. Electron. 22, 458 (2011)CrossRefGoogle Scholar
  23. 23.
    B. Shao, J. Qiu, K. Zhu, H. Gu, H. Ji, J. Mater. Sci. Mater. Electron 23, 1455 (2012)CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 2012

Authors and Affiliations

  • Hua Wang
    • 1
  • Xia Zhai
    • 1
  • Jiwen Xu
    • 1
  • Changlai Yuan
    • 1
  • Ling Yang
    • 1
  1. 1.School of Materials Science and EngineeringGuilin University of Electronic TechnologyGuilinChina

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