Abstract
Multiferroic BiFe0.95Co0.05O3 thin films were fabricated on Pt/Ti/SiO2/Si substrates at various temperatures by pulsed laser deposition. It was found the deposition temperature had great effects on phase purity, orientation, microstructure and multiferroic properties of these films. The optimized deposition temperature was close to 600 °C. Polarization–electric field (P–E) and magnetization–magnetic field (M–H) hysteresis loops at room temperature were observed simultaneously in the films fabricated at 600 °C. The remnant polarization, coercive electric field (P r , E c ) and the remnant magnetization, coercive magnetic field (M r , H c ) of the films deposited at 600 °C were (0.95 μC/cm2, 31 kV/cm) and (0.59 emu/cm3, 130 Oe), respectively. These results might have implications for further investigations on high quality BiFe0.95Co0.05O3 multiferroic films.
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Acknowledgments
This work was supported by National Natural Science Foundation no. 50805076, National Natural Science Key Corporation Foundations no. 60910007, 61161120323, and NS2012014.
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Zhang, H., Long, WJ., Chen, YQ. et al. Effects of deposition temperature on phase purity, orientation, microstructure and property of cobalt substituted bismuth ferrite thin films. J Mater Sci: Mater Electron 23, 2157–2161 (2012). https://doi.org/10.1007/s10854-012-0732-7
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DOI: https://doi.org/10.1007/s10854-012-0732-7