Growth and characterization of lead selenide thin films

  • Sethuramachandran Thanikaikarasan
  • Thaiyan Mahalingam
  • V. Dhanasekaran
  • A. Kathalingam
  • Jin-Koo Rhee


Growth of lead selenide thin films has been carried out electrochemically on indium doped tin oxide coated conducting glass substrates from an aqueous acidic bath consists of Pb(CH3COO)2 and SeO2. X-ray diffraction analysis has been carried out to determine the crystal structure and phases of the deposited films. Microstructural parameters such as crystallite size, strain and dislocation density which have been evaluated from X-ray diffraction data. Surface morphology and film composition have been analyzed using scanning electron microscopy and energy dispersive analysis by X-rays. The effect of bath temperature on structural, microstructural, morphological and compositional properties of the films are studied and the results are discussed. Optical absorption measurements shows that the deposited films possess a direct band gap value of 0.38 eV.


Bath Temperature PbSe SeO2 Chemical Bath Deposition Texture Coefficient 
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  1. 1.
    K. Wei Li, X. Tian Meng, X. Liang, H. Wang, H. Yan, J. Solid State Electrochem. 10, 48 (2006)CrossRefGoogle Scholar
  2. 2.
    V.V. Tomaev, M.F. Panov, Glass Phys. Chem. 32, 370 (2006)CrossRefGoogle Scholar
  3. 3.
    N.V. Golubchenko, V.A. Moshnikov, D.B. Chesnokova, Glass Phys. Chem. 32, 337 (2006)CrossRefGoogle Scholar
  4. 4.
    V.D. Das, K.S. Bhat, J. Mater. Sci. 1, 169 (1990)Google Scholar
  5. 5.
    A.N. Molin, A.I. Dikusar, Thin Solid Films 3, 265 (1995)Google Scholar
  6. 6.
    G. Schmidt, Chem. Rev. 92, 1709 (1992)CrossRefGoogle Scholar
  7. 7.
    B. Li, Y. Xie, J. Huang, Y.T. Qian, Ultrason. Sonochem. 6, 217 (1999)CrossRefGoogle Scholar
  8. 8.
    J.J. Zhu, O. Palchick, S.G. Chen, A. Gedanken, J. Phys. Chem. 104, 7344 (2000)CrossRefGoogle Scholar
  9. 9.
    J.J. Zhu, S.T. Aruna, Y. Koltypin, A. Gedanken, Chem. Mater. 12, 143 (2000)CrossRefGoogle Scholar
  10. 10.
    S. Thanikaikarasan, T. Mahalingam, K. Sundaram, A. Kathalingam, Y. Deak Kim, T. Kim, Vacuum 83, 1066 (2009)CrossRefGoogle Scholar
  11. 11.
    H. Joon Kwon, S. Thanikaikarasan, T. Mahalingam, C. Sanjeeviraja, Y. Deak Kim, J. Mater. Sci. Mater. Electron. 19, 1086 (2008)CrossRefGoogle Scholar
  12. 12.
    E.A. Streltsov, N.P. Osipovich, L.S. Ivashkevich, A.S. Lyakhov, V.V. Sviridov, Electrochim. Acta 43, 869 (1998)CrossRefGoogle Scholar
  13. 13.
    H. Saloniemi, T. Kanniainen, M. Ritala, M. Leskelä, R. Lappalainen, J. Mater. Chem. 8, 651 (1998)CrossRefGoogle Scholar
  14. 14.
    T. Mahalingam, S. Thanikaikarasan, V. Dhanasekaran, A. Kathalingam, S. Velumani, J.-K. Rhee, Mater. Sci. Eng. B 174, 257 (2010)CrossRefGoogle Scholar
  15. 15.
    S. Thanikaikarasan, T. Mahalingam, S. Lee, H. Lim, S. Velumani, J.-K. Rhee, Mater. Sci. Eng. B 174, 231 (2010)CrossRefGoogle Scholar
  16. 16.
    S. Thanikaikarasan, T. Mahalingam, K. Sundaram, T. Kim, Y. Deak Kim, S. Velumani, Adv. Mater. Res. 68, 69 (2009)CrossRefGoogle Scholar
  17. 17.
    Joined Council for Powder Diffracted System-International Centre for Diffraction Data. PDF 06-0354 (2003)Google Scholar
  18. 18.
    S. Thanikaikarasan, T. Mahalingam, M. Raja, T. Kim, Y. Deak Kim, J. Mater. Sci. Mater. Electron. 20, 727 (2009)CrossRefGoogle Scholar
  19. 19.
    B.D. Cullity, Elements of X-ray diffraction (Addison-Wesley, MA, 1978)Google Scholar
  20. 20.
    S. Thanikaikarasan, X. Sahaya Shajan, V. Dhanasekaran, T. Mahalingam, J. Mater. Sci. 46, 4034 (2011)CrossRefGoogle Scholar
  21. 21.
    G.K. Williamson, R.E. Smallman, Philos. Mag. 1, 34 (1956)CrossRefGoogle Scholar
  22. 22.
    T. Mahalingam, S. Thanikaikarasan, R. Chandramohan, M. Raja, C. Sanjeeviraja, J.H. Kim, Y. Deak Kim, Mater. Chem. Phys. 106, 369 (2007)CrossRefGoogle Scholar
  23. 23.
    G. Radovsky, Z. Dashevsky, V. Kasiyan, M. Auslender, S. Hava, J. Alloys Compd. 501, 6 (2010)CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media, LLC 2012

Authors and Affiliations

  • Sethuramachandran Thanikaikarasan
    • 1
  • Thaiyan Mahalingam
    • 2
  • V. Dhanasekaran
    • 2
  • A. Kathalingam
    • 3
  • Jin-Koo Rhee
    • 3
  1. 1.Centre for Scientific and Applied ResearchPSN College of Engineering and TechnologyTirunelveliIndia
  2. 2.Department of PhysicsAlagappa UniversityKaraikudiIndia
  3. 3.Millimeter-Wave Innovation Technology Research CentreDongguk UniversitySeoulKorea

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