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Growth and characterization of lead selenide thin films

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Abstract

Growth of lead selenide thin films has been carried out electrochemically on indium doped tin oxide coated conducting glass substrates from an aqueous acidic bath consists of Pb(CH3COO)2 and SeO2. X-ray diffraction analysis has been carried out to determine the crystal structure and phases of the deposited films. Microstructural parameters such as crystallite size, strain and dislocation density which have been evaluated from X-ray diffraction data. Surface morphology and film composition have been analyzed using scanning electron microscopy and energy dispersive analysis by X-rays. The effect of bath temperature on structural, microstructural, morphological and compositional properties of the films are studied and the results are discussed. Optical absorption measurements shows that the deposited films possess a direct band gap value of 0.38 eV.

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References

  1. K. Wei Li, X. Tian Meng, X. Liang, H. Wang, H. Yan, J. Solid State Electrochem. 10, 48 (2006)

    Article  Google Scholar 

  2. V.V. Tomaev, M.F. Panov, Glass Phys. Chem. 32, 370 (2006)

    Article  CAS  Google Scholar 

  3. N.V. Golubchenko, V.A. Moshnikov, D.B. Chesnokova, Glass Phys. Chem. 32, 337 (2006)

    Article  CAS  Google Scholar 

  4. V.D. Das, K.S. Bhat, J. Mater. Sci. 1, 169 (1990)

    CAS  Google Scholar 

  5. A.N. Molin, A.I. Dikusar, Thin Solid Films 3, 265 (1995)

    Google Scholar 

  6. G. Schmidt, Chem. Rev. 92, 1709 (1992)

    Article  Google Scholar 

  7. B. Li, Y. Xie, J. Huang, Y.T. Qian, Ultrason. Sonochem. 6, 217 (1999)

    Article  CAS  Google Scholar 

  8. J.J. Zhu, O. Palchick, S.G. Chen, A. Gedanken, J. Phys. Chem. 104, 7344 (2000)

    Article  CAS  Google Scholar 

  9. J.J. Zhu, S.T. Aruna, Y. Koltypin, A. Gedanken, Chem. Mater. 12, 143 (2000)

    Article  CAS  Google Scholar 

  10. S. Thanikaikarasan, T. Mahalingam, K. Sundaram, A. Kathalingam, Y. Deak Kim, T. Kim, Vacuum 83, 1066 (2009)

    Article  CAS  Google Scholar 

  11. H. Joon Kwon, S. Thanikaikarasan, T. Mahalingam, C. Sanjeeviraja, Y. Deak Kim, J. Mater. Sci. Mater. Electron. 19, 1086 (2008)

    Article  Google Scholar 

  12. E.A. Streltsov, N.P. Osipovich, L.S. Ivashkevich, A.S. Lyakhov, V.V. Sviridov, Electrochim. Acta 43, 869 (1998)

    Article  CAS  Google Scholar 

  13. H. Saloniemi, T. Kanniainen, M. Ritala, M. Leskelä, R. Lappalainen, J. Mater. Chem. 8, 651 (1998)

    Article  CAS  Google Scholar 

  14. T. Mahalingam, S. Thanikaikarasan, V. Dhanasekaran, A. Kathalingam, S. Velumani, J.-K. Rhee, Mater. Sci. Eng. B 174, 257 (2010)

    Article  CAS  Google Scholar 

  15. S. Thanikaikarasan, T. Mahalingam, S. Lee, H. Lim, S. Velumani, J.-K. Rhee, Mater. Sci. Eng. B 174, 231 (2010)

    Article  CAS  Google Scholar 

  16. S. Thanikaikarasan, T. Mahalingam, K. Sundaram, T. Kim, Y. Deak Kim, S. Velumani, Adv. Mater. Res. 68, 69 (2009)

    Article  CAS  Google Scholar 

  17. Joined Council for Powder Diffracted System-International Centre for Diffraction Data. PDF 06-0354 (2003)

  18. S. Thanikaikarasan, T. Mahalingam, M. Raja, T. Kim, Y. Deak Kim, J. Mater. Sci. Mater. Electron. 20, 727 (2009)

    Article  CAS  Google Scholar 

  19. B.D. Cullity, Elements of X-ray diffraction (Addison-Wesley, MA, 1978)

    Google Scholar 

  20. S. Thanikaikarasan, X. Sahaya Shajan, V. Dhanasekaran, T. Mahalingam, J. Mater. Sci. 46, 4034 (2011)

    Article  CAS  Google Scholar 

  21. G.K. Williamson, R.E. Smallman, Philos. Mag. 1, 34 (1956)

    Article  CAS  Google Scholar 

  22. T. Mahalingam, S. Thanikaikarasan, R. Chandramohan, M. Raja, C. Sanjeeviraja, J.H. Kim, Y. Deak Kim, Mater. Chem. Phys. 106, 369 (2007)

    Article  CAS  Google Scholar 

  23. G. Radovsky, Z. Dashevsky, V. Kasiyan, M. Auslender, S. Hava, J. Alloys Compd. 501, 6 (2010)

    Article  CAS  Google Scholar 

Download references

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Authors and Affiliations

  1. Centre for Scientific and Applied Research, PSN College of Engineering and Technology, Tirunelveli, 627 152, Tamil Nadu, India

    Sethuramachandran Thanikaikarasan

  2. Department of Physics, Alagappa University, Karaikudi, 630 003, Tamil Nadu, India

    Thaiyan Mahalingam & V. Dhanasekaran

  3. Millimeter-Wave Innovation Technology Research Centre, Dongguk University, Seoul, 100 715, Korea

    A. Kathalingam & Jin-Koo Rhee

Authors
  1. Sethuramachandran Thanikaikarasan
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  2. Thaiyan Mahalingam
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  3. V. Dhanasekaran
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  4. A. Kathalingam
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  5. Jin-Koo Rhee
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Corresponding authors

Correspondence to Sethuramachandran Thanikaikarasan or Thaiyan Mahalingam.

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Thanikaikarasan, S., Mahalingam, T., Dhanasekaran, V. et al. Growth and characterization of lead selenide thin films. J Mater Sci: Mater Electron 23, 1562–1568 (2012). https://doi.org/10.1007/s10854-012-0629-5

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  • DOI: https://doi.org/10.1007/s10854-012-0629-5

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