Planar defects and phase transformation in ZnSe nanosaws
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ZnSe nanostructures were grown on Si substrates by Au catalyzed vapor phase growth at 725°C. Three different types of ZnSe nanosaws have been observed using transmission electron microscopy (TEM). Detailed structural and microstructural investigation has been carried out using electron diffraction and high-resolution TEM (HRTEM). It has been found that stacking faults and phase transformation are important features of the nanosaw formation. The controlled formation of these ZnSe nanosaws could have very important device applications.
KeywordsHigh Resolution Transmission Electron Microscopy ZnSe High Resolution Transmission Electron Microscopy Planar Defect High Resolution Transmission Electron Microscopy Image
The authors gratefully acknowledge financial support from CIPI, NSERC, CFI, BCKDF, CITO, MMO, DRDC and AFOSR in carrying out this research.