Studying electrical transport in carbon nanotubes by conductance atomic force microscopy

  • C. Gómez-Navarro
  • P. J. de Pablo
  • J. Gómez-Herrero


An introduction to conductance atomic force microscopy in the context of carbon nanotubes is provided where the main problems and performances of this technique are discussed. The conductance measured in SWNT as a function of the loading force applied by an AFM metallized tip is reported. These experiments allow us to study the process of the electrical contact formation between the tip and the nanotube. This will also lead to a study of the electromechanical properties of nanotubes for radial deformations.


Microscopy Atomic Force Microscopy Carbon Nanotubes Electronic Material Electrical Contact 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


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Copyright information

© Springer Science + Business Media, LLC 2006

Authors and Affiliations

  • C. Gómez-Navarro
    • 1
  • P. J. de Pablo
    • 1
  • J. Gómez-Herrero
    • 1
  1. 1.Departamento de Física de la Materia CondensadaUniversidad Autónoma de MadridMadridSpain

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