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Characterization of polystyrene and doped polymethylmethacrylate thin layers

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Abstract

About 1 μm thick films of polystyrene (PS) and polymethylmethacrylate (PMMA) were prepared from solutions using spin-coating method. The PMMA films were doped with diphenylsulfoxide (DS) up to 45 wt%. Glass transition temperature (T g ) of doped PMMA films was determined by DSC technique and relative permittivity (ε) as a function of the sample temperature was determined from capacitance measurement. The dependence of polarization (P) on electric field (E) and the temperature was measured using a standard Sawyer-Tower circuit. Spectral dependence of film refractive index was measured using a refractometer. The glass transition temperature T g of PMMA/DS composite was found to be decreasing function of the DS concentration. Relative permittivity ε of unpolar PS is lower than that of polar PMMA. The PS permittivity does not depend on the sample temperature. For PMMA the permittivity is increasing function of both, DS dopant concentration and sample temperature. The dependence of the polarization on the electric field on PS film does not exhibit a hysteresis and indicate no polarization contrary to PMMA. PMMA/DS composites exhibit easier and larger polaribility and a permanent dipole moment. Resulting polarization is an increasing function of DS concentration. Refractive index of both pristine PS and PMMA decreases with increasing wave length. The refractive index of PMMA/DS composites depends on the DS concentration.

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Authors and Affiliations

  1. Department of Solid State Engineering, Institute of Chemical Technology, 166 28, Prague, Czech Republic

    T. Podgrabinski, E. Hrabovská & V. Švorčík

  2. Nuclear Physics Institute, Academy of Sciences of the Czech Republic, 250 68, Řež, Czech Republic

    V. Hnatowicz

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  1. T. Podgrabinski
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  2. E. Hrabovská
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  3. V. Švorčík
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  4. V. Hnatowicz
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Correspondence to V. Švorčík.

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Podgrabinski, T., Hrabovská, E., Švorčík, V. et al. Characterization of polystyrene and doped polymethylmethacrylate thin layers. J Mater Sci: Mater Electron 16, 761–765 (2005). https://doi.org/10.1007/s10854-005-4980-7

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  • DOI: https://doi.org/10.1007/s10854-005-4980-7

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