Influence of 3d-elements on dielectric properties of BaTiO3 ceramics

  • Shuren Zhang
  • Sheng Wang
  • Xiaohua Zhou
  • Bo Li
  • Zhu Chen


The microstructure and dielectric properties of Yb-Mn- and Yb-Ni-substituted BaTiO3 ceramics are investigated in this paper. Both Yb-Mn- and Yb-Ni-substituted BaTiO3 ceramics satisfy the X8R specification (−55 C to 150 C, Δ C = ±15% or less) for automotive application when CaZrO3 is incorporated in the formulations. It is found that both Mn and Ni ions can suppress the diffusion of Yb and CaZrO3 into BaTiO3 grains, resulting in formation of core-shell structures in the grains. It is found that Mn is more favorable to stabilize the core-shell structure in BaTiO3 ceramics as compared with Ni.


Microstructure Electronic Material Dielectric Property BaTiO3 Automotive Application 


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  1. 1.
    Y.-S. JUNG, E.-S. NA, U. PAIK, J. LEE and J. KIM, Mater. Res. Bull. 37 (2002) 1633.CrossRefGoogle Scholar
  2. 2.
    S. SATO, Y. FUJIKAWA and Y. TERADA, USP 6,403,513 B1, 11 June 2002.Google Scholar
  3. 3.
    Y. LI, X. YAO and L. ZHANG, Ceram. Int. 30 (2004) 1325.CrossRefGoogle Scholar
  4. 4.
    D. HENNINGS, J. Eur. Ceram. Soc. 21 (2001) 1637.CrossRefGoogle Scholar
  5. 5.
    J. H. HWANG, S. K. CHOI and Y. H. HAN, Jpn. J. Appl. Phys. 40 (2001) 4952.CrossRefGoogle Scholar
  6. 6.
    H.-J. HAGEMANN and H. IHRIG, Phys. Rev. B. 20 (1979) 3871.CrossRefGoogle Scholar
  7. 7.
    M. FUKUNAGA, G. LI, Y. UESU and K. KOHN, Jnp. J. Appl. Phys. 41 (2002) 6926.Google Scholar
  8. 8.
    M. HAFID, S. TAKEOKA, S. KISHIDA, T. FUKAMI and J. SHENG, Jnp. J. Appl. Phys. 37 (1998) 3370.Google Scholar
  9. 9.
    D. HENNINGS and G. ROSENSTEIN, J. Am. Ceram. Soc. 67 (1984) 249.Google Scholar
  10. 10.
    H. KISHI, Y. OKINO, M. HONDA, Y. IGUCHI, M. IMAEDA, Y. TAKAHACHI, H. OHSATO and T. OKUDA, Jpn. J. Appl. Phys. 36 (1997) 5954.CrossRefGoogle Scholar
  11. 11.
    S. WANG. S. ZHANG, X. ZHOU, B. LI and Z. CHEN, submitted to J. Mater. Sci.Google Scholar
  12. 12.
    Y. MIZUNO, Y. OKINO, N. KOHZU and H. KISHI, Jpn. J. Appl. Phys. 37 (1998) 5227.CrossRefGoogle Scholar
  13. 13.
    T. TAKEUCHI, K. ADO, T. ASAI, H. KAGEYAMA, Y. SAITO, C. MASQUELIER and O. NAKAMURA, J. Am. Ceram. Soc. 77 (1994) 1665.CrossRefGoogle Scholar
  14. 14.
    T. R. ARMSTRONG and R. C. BUCHANAN, Jnp. J. Appl. Phys. 73 (1990) 1268.Google Scholar

Copyright information

© Springer Science + Business Media, Inc. 2005

Authors and Affiliations

  • Shuren Zhang
    • 1
  • Sheng Wang
    • 1
  • Xiaohua Zhou
    • 1
  • Bo Li
    • 1
  • Zhu Chen
    • 1
  1. 1.School of Microelectronics and Solid-State ElectronicsUniversity of Electronic Science and Technology of ChinaChengduPeople's Republic of China

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