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Electrical properties of stacked CuInSe2 thin films

  • A. Ashour
  • A. A. Akl
  • A. A. Ramadan
  • K. Abd EL-Hady
Article

Abstract

CuInSe2 thin films have been prepared by the processing of stacked elemental layer (SEL) on glass substrates followed by annealing in air for different times. Films produced at 300 and 350 C showed n-type semiconductor due to indium interstitial donors. Electrical properties (resistivity) of the CuInSe2 films have been systematically studied in terms of annealing temperatures and times. The resistivity was in the interval 101–104 Ω cm and influenced by the heating time and decreased with temperature. The activation energy ranged from 0.046 to 0.154 eV in the range 300–600 K. The scattering process due to the energy barriers that exist between adjacent grains was considered.

Keywords

Indium Thin Film Activation Energy Electrical Property Electronic Material 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science + Business Media, Inc. 2005

Authors and Affiliations

  • A. Ashour
    • 1
  • A. A. Akl
    • 1
  • A. A. Ramadan
    • 2
  • K. Abd EL-Hady
    • 1
  1. 1.Faculty of Science, Physics DepartmentMinia UniversityMiniaEgypt
  2. 2.Faculty of Science, Physics DepartmentHelwan UniversityHelwanEgypt

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