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Dielectric and a.c. conductivity studies in pure and manganese doped layered K2Ti4O9 ceramics

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Abstract

The results of a.c. electrical conductivity studies have been reported on pure K2Ti4O9 (named PT) and its 1.0 molar percentage of MnO2 doped derivative (named MPT) ceramics in the temperature range 373–898 K. Four regions have been identified in the log(σa.c. T) versus 1000/T plots. Conduction in the lowest temperature region I is attributed to the mixed exchangeable interlayer ionic and electronic hopping (polaron) conduction. A dielectric loss peak with distribution of relaxation times perturbs the conduction in next regions II and III. However, in region III for both the samples non-relaxor ferroelectric property may be proposed. The modified interlayer ionic conduction has been proposed towards the higher temperature region IV. Loss tangent (tan δ) versus frequency and dielectric constant (ε) versus frequency plots at different temperatures have also been given for both the samples. The results of tan δ versus temperature and ε versus temperature at different frequencies have further been reported for both of the above compounds in this paper.

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Authors and Affiliations

  1. Department of Physics, P.P.N. College, Kanpur, 208001, India

    Shripal, S. Badhwar & Deepam Maurya

  2. Materials Science Programme, I.I.T., Kanpur, 5208016, India

    Jitendra Kumar

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  1. Shripal
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  2. S. Badhwar
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  3. Deepam Maurya
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  4. Jitendra Kumar
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Shripal, Badhwar, S., Maurya, D. et al. Dielectric and a.c. conductivity studies in pure and manganese doped layered K2Ti4O9 ceramics. J Mater Sci: Mater Electron 16, 495–500 (2005). https://doi.org/10.1007/s10854-005-2723-4

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  • DOI: https://doi.org/10.1007/s10854-005-2723-4

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