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Characterization of grain boundary disconnections in SrTiO3 Part II: the influence of superimposed disconnections on image analysis

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Abstract

Disconnections were recently shown to play a role in the mechanism of grain boundary motion in general grain boundaries in SrTiO3. In this work, we demonstrate the existence of disconnections in the viewing direction along the projected thickness of transmission electron microscopy samples and characterize possible aspects of the structure of these disconnections. We show that the presence of steps along the viewing direction may result in the appearance of a disordered region at the boundary, while it is actually composed of ordered crystalline material. We discuss the subsequent complications in analysis of transmission electron microscopy data and strict meaning of the term “edge-on” for grain boundaries.

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Acknowledgements

This work was partially supported via a German-Israel Fund (GIF) Grant No. I-1276-401.10/2014. The authors acknowledge the British Council for funding a visit by HS to the UK. AIK acknowledges the European Union under the Seventh Framework Programme under a contract for an Integrated Infrastructure Initiative Reference 312483-ESTEEM2. Financial support from EPSRC (Platform Grant EP/K032518/1) is also acknowledged.

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Authors and Affiliations

  1. School of Engineering, Brown University, Providence, USA

    Hadas Sternlicht

  2. Materials Engineering, Purdue University, West Lafayette, USA

    Wolfgang Rheinheimer

  3. Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK

    Judy Kim, Emanuela Liberti & Angus I. Kirkland

  4. Electron Physical Sciences Imaging Centre, Diamond Lightsource Ltd., Diamond House, Didcot, OX11 0DE, UK

    Judy Kim, Emanuela Liberti & Angus I. Kirkland

  5. Karlsruhe Institute of Technology, Institute of Applied Materials, Karlsruhe, Germany

    Michael J. Hoffmann

  6. Department of Materials Science and Engineering, Technion – Israel Institute of Technology, Haifa, Israel

    Wayne D. Kaplan

Authors
  1. Hadas Sternlicht
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  2. Wolfgang Rheinheimer
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  3. Judy Kim
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  4. Emanuela Liberti
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  5. Angus I. Kirkland
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  6. Michael J. Hoffmann
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  7. Wayne D. Kaplan
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Corresponding author

Correspondence to Wayne D. Kaplan.

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Hadas Sternlicht: Conducted when the author was at Department of Materials Science and Engineering, Technion – Israel Institute of Technology, Haifa, Israel.

Wolfgang Rheinheimer: Conducted when the author was at Karlsruhe Institute of Technology, Institute of Applied Materials, Karlsruhe, Germany.

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Sternlicht, H., Rheinheimer, W., Kim, J. et al. Characterization of grain boundary disconnections in SrTiO3 Part II: the influence of superimposed disconnections on image analysis. J Mater Sci 54, 3710–3725 (2019). https://doi.org/10.1007/s10853-018-3095-5

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  • DOI: https://doi.org/10.1007/s10853-018-3095-5

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