The effects of eutectic silicon on grain refinement in an Al–Si alloy processed by accumulative continuous extrusion forming
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Grains of Al–1Si(wt%) alloy were refined by accumulative continuous extrusion forming (ACEF). Electron backscatter diffraction and transmission electron microscopy were used to analyze the microstructure evolution of the Al–1Si(wt%) alloy. The grain size of the alloy decreased from 54.36 to 2.59 μm after four passes of ACEF. The grain refinement was attributed to continuous dynamic recrystallization (CDRX). The enhanced effect of nanosized precipitates on CDRX was pronounced. Nanosized eutectic Si precipitates retained a high density of dislocations in the alloy by promoting their generation and pile-up, resulting in an increase in the driving force for CDRX and a consequent promotion of grain refinement. After 4 ACEF passes, the tensile yield strength of the alloy at room temperature increased from 102 MPa to 117 MPa. Further, the elongation of the alloy at room temperature decreased from 38 to 17 % after 3 ACEF passes and subsequently increased to 23 % after 4 ACEF passes.
KeywordsSevere Plastic Deformation Misorientation Angle Eutectic Silicon Tensile Yield Strength Dislocation Wall
The authors are grateful for the financial support provided by the National Natural Science Foundation of China under Grant Nos. 51474063 and 51674077 and by the Fundamental Research Funds for the Central Universities under Grant No. N150204016.
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Conflicts of interest
The authors declare that there is no conflict of interest regarding the publication of this paper.
- 1.Hatch JE, Association A (1984) Aluminum: properties and physical metallurgy. ASM International, Materials ParkGoogle Scholar
- 16.Shen YF, Guan RG, Zhao ZY, Misra RDK (2015) Ultrafine-grained Al–0.2Sc–0.1Zr alloy: the mechanistic contribution of nano-sized precipitates on grain refinement during the novel process of accumulative continuous extrusion. Acta Mater 100:247–255. doi: 10.1016/j.actamat.2015.08.043 CrossRefGoogle Scholar
- 23.ASTME112 (2010) Standard test methods for determining average grain sizeGoogle Scholar
- 24.Hirsch PB (1965) Electron microscopy of thin crystals. Butterworths, LondonGoogle Scholar
- 27.Rollett A, Humphreys F, Rohrer GS, Hatherly M (2004) Recrystallization and related annealing phenomena, 2nd edn. Elsevier, OxfordGoogle Scholar