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Dielectric relaxation in Se80−xTe20Snx chalcogenide glasses

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Abstract

This study reports the temperature and frequency dependence of dielectric constant (ε′) and dielectric loss (ε′′) in glassy Se80−xTe20Snx (x = 0, 2, 4, 6) alloys. The measurements have been made in the frequency range (1–500 KHz) and in the temperature range 305–335 K. The results indicate that the dielectric dispersion exists in the present glassy systems in the above frequency and temperature range. The composition dependence of the dielectric constant, dielectric loss and activation energy thermally activated crystallization is also discussed.

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Authors and Affiliations

  1. Department of Physics, Banaras Hindu University, Varanasi, 221 005, India

    A. Sharma & N. Mehta

  2. Department of Physics, Harcourt Butler Technological Institute, Kanpur, 208 002, India

    A. Kumar

Authors
  1. A. Sharma
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  2. N. Mehta
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  3. A. Kumar
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Correspondence to N. Mehta.

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Sharma, A., Mehta, N. & Kumar, A. Dielectric relaxation in Se80−xTe20Snx chalcogenide glasses. J Mater Sci 46, 4509–4516 (2011). https://doi.org/10.1007/s10853-011-5344-8

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  • DOI: https://doi.org/10.1007/s10853-011-5344-8

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