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Journal of Materials Science

, Volume 46, Issue 11, pp 3952–3959 | Cite as

Short range order structure of amorphous B4C boron carbide thin films

  • Ruqiang Bao
  • Douglas B. Chrisey
Article

Abstract

B4C boron carbide thin films deposited by radio frequency magnetron sputtering in the temperature ranging from room temperature to 650 °C are amorphous. In this article, pair distribution function (PDF) and Fourier transform infrared (FTIR) spectroscopy were used to characterize the short range order (SRO) structure of amorphous B4C thin films. FTIR spectra indicated that icosahedrons exist in the amorphous B4C thin films. The existence of icosahedrons was further verified by the PDFs of amorphous B4C thin films, which were derived from digital selected area electron diffraction patterns. Furthermore, by comparing the PDFs of amorphous B4C thin films with those of three crystalline boron modifications and three structural models of boron carbides (B4C or B10C2), the SRO structure of amorphous B4C thin film was revealed to be similar to that of β-rhombohedral boron, but with the peak shifted to shorter distance.

Keywords

Boron High Resolution Transmission Electron Microscopy Boron Atom Boron Carbide Select Area Electron Diffraction Pattern 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgement

The authors would express their thanks to Prof. Pawel Keblinski at Rensselaer Polytechnic Institute for useful discussion and suggestions about the calculation of the reduced radial distribution function and pair distribution function. This study was supported by the DARPA Micro-Isotope Power Sources Program and Rensselaer Polytechnic Institute start-up funds.

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Copyright information

© Springer Science+Business Media, LLC 2011

Authors and Affiliations

  1. 1.Department of Materials Science and EngineeringRensselaer Polytechnic InstituteTroyUSA

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