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Journal of Materials Science

, Volume 44, Issue 19, pp 5288–5296 | Cite as

Nanoscale defects and microwave properties of (BaSr)TiO3 ferroelectric thin films

  • T. J. Jackson
  • I. P. Jones
Ferroelectrics

Abstract

Thin film ferroelectrics may have important applications in microwave devices but in general have significantly worse properties than bulk material. This is principally because of secondary and point defects. The natures of the defects are reviewed and strategies to study and remove them outlined.

Keywords

Dielectric Property Burger Vector Loss Tangent Microwave Frequency Misfit Dislocation 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgements

We would like to acknowledge the Engineering and Physical Sciences Research Council for financial support. We would like to thank our colleagues P Bao, C Bayer, H Bouyanfif, R Chakalov, CNW Darlington, J Hriljac, WF Hu, F Huang, Y Koutsonas, MJ Lancaster, YH Liu, SRC McMitchell, JH Park, G Passeriuex, A Porch, HT Su, PM Suherman, RI Tchakalova, YY Tse and X Wang for their work and support.

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Copyright information

© Springer Science+Business Media, LLC 2009

Authors and Affiliations

  1. 1.School of Electronic, Electrical and Computer EngineeringUniversity of BirminghamBirminghamUK
  2. 2.School of Metallurgy and MaterialsUniversity of BirminghamBirminghamUK

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