Abstract
Photocatalytic titania thin films deposited on float glass by chemical vapor deposition were analyzed by transmission electron microscopy, atomic force microscopy, Raman spectroscopy, and X-ray diffraction. Raman spectroscopy results indicate its phase sensitivity in the presence of trace amount of anatase. This suggests a preferable method of using Raman spectroscopy to characterize mixed phases of titania thin films, especially when titania coatings are deposited on other crystalline oxide materials, for example, tin oxide.
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The authors would like to thank Prof. Andre Sommer of Miami University for Raman spectroscopy measurement.
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Lu, S.W., Harris, C., Walck, S. et al. Phase sensitivity of Raman spectroscopy analysis of CVD titania thin films. J Mater Sci 44, 541–544 (2009). https://doi.org/10.1007/s10853-008-3086-z
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DOI: https://doi.org/10.1007/s10853-008-3086-z