Journal of Materials Science

, Volume 41, Issue 9, pp 2627–2630 | Cite as

Fabrication of a nano-magnet on a piezo-driven tip in a TEM sample holder


A nanometer-sized magnet (nano-magnet) was fabricated on the tip of a tungsten needle by electron-beam-induced deposition with Fe(CO)5 gas. The needle tip, which can be moved with a stepping motor and piezo-driver, was attached inside a specially designed TEM specimen holder. This nano-magnet on the piezo-driven tip is capable of making an approach to magnetic nanostructures formed on a substrate so that the nanometer-scale magnetic interaction could be studied. Electron holography observation of the magnetic field around the nano-magnet showed that the residual magnetic flux density Br of the nano-magnet was about 0.48 T.


Polymer Magnetic Field Tungsten Flux Density Magnetic Flux 
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  1. 1.
    D. J. Smith, R. E. Dunin-Borkowski, M. R. Mccartney, B. Kardynal and M. R. Scheinfein, J. Appl. Phys. 87 (2000) 7400.CrossRefGoogle Scholar
  2. 2.
    U. Welp, V. K. Vlasko-Vlasov, G. W. Crabtree, J. Hiller and N. Zaluzec, ibid. 93 (2003) 7056.CrossRefGoogle Scholar
  3. 3.
    S. P. Li, M. Natali, A. Lebib, A. Pepin, Y. Chen and Y. B. Xu, J. Magn. Magn. Mater. 241 (2002) 447.CrossRefGoogle Scholar
  4. 4.
    Y. Otani, B. Pannetier, J. P. Nozieres and D. Givord, ibid. 126 (1993) 622.CrossRefGoogle Scholar
  5. 5.
    A. Sugawara, T. Coyle, G. G. Hembree and M. R. Scheinfein, Appl. Phys. Lett. 70 (1997) 1043.CrossRefGoogle Scholar
  6. 6.
    K. Liu, J. Nogues, C. Leighton, H. Masuda, K. Nishio, I. V. Roshchin and I. K. Schuller, ibid. 81 (2002) 4434.CrossRefGoogle Scholar
  7. 7.
    T. Kizuka, H. Ohmi, T. Sumi, K. Kumazawa, S. Deguchi, M. Naruse, S. Fujisawa, S. Sasaki, A. Yabe and Y. Enomoto, Jpn. J. Appl. Phys. 40 (2001) L170.CrossRefGoogle Scholar
  8. 8.
    H. Ohnishi, Y. Kondo and K. Takayanagi, Nature 395 (1998) 780.CrossRefGoogle Scholar
  9. 9.
    K. Matsunaga, S. Ii, C. Iwamoto, T. Yamamoto and Y. Ikuhara, Nanotechnology 15 (2004) S376.CrossRefGoogle Scholar
  10. 10.
    D. Shindo, Y. Park, Y. Gao and H. S. Park, J. Appl. Phys. 95 (2004) 6521.CrossRefGoogle Scholar
  11. 11.
    J. Cumings, A. Zettl, M. R. Mccartney and J. C. H. Spence, Phys. Rev. Lett. 88 (2002) 056804-1.CrossRefGoogle Scholar
  12. 12.
    H. W. P. Koops, A. Kaya and J. J. Weber, Vac. Sci. Technol. B 13 (1995) 2400.CrossRefGoogle Scholar
  13. 13.
    H. W. P. Koops, C. Schossler, A. Kaya and M. J. Weber, ibid. 14 (1996) 4105.CrossRefGoogle Scholar
  14. 14.
    I. Utke, P. Hoffmann, B. Dwir, K. Leifer, E. Kapon and P. J. Doppelt, J. Vac. Sci. Technol. B 18 (2000) 3168.CrossRefGoogle Scholar
  15. 15.
    I. Utke, A. Luisier, P. Hoffmann, D. Laub and P. A. Buffar, Appl. Phys. Lett. 81 (2002) 3245.CrossRefGoogle Scholar
  16. 16.
    K. Mitsuishi, M. Shimojo, M. Han and K. Furuya, ibid. 83 (2003) 2064.CrossRefGoogle Scholar
  17. 17.
    M. Tanaka, M. Shimojo, K. Mitsuishi and K. Furuya, Appl. Phys. A 78 (2004) 543.CrossRefGoogle Scholar
  18. 18.
    M. Shimojo, K. Mitsuishi, A. Tameike and K. Furuya, J. Vac. Sci. Technol. B 22 (2004) 742.CrossRefGoogle Scholar
  19. 19.
    M. Han, K. Mitsuishi, M. Shimojo and K. Furuya, ibid. 84 (2004) 1281.Google Scholar
  20. 20.
    R. R. Kunz and T. M. Mayer, Appl. Phys. Lett. 50 (1987) 962.CrossRefGoogle Scholar
  21. 21.
    M. Shimojo, M. Takeguchi, M. Tanaka, K. Mitsuishi and K. Furuya, Appl. Phys. A 79 (2004) 1869.CrossRefGoogle Scholar
  22. 22.
    P. A. Midgley, Micron 32 (2001) 167.CrossRefGoogle Scholar
  23. 23.
    M. R. Mccartney and M. Gajdardziska-Josifovska, Ultramicroscopy 53 (1994) 283.CrossRefGoogle Scholar

Copyright information

© Springer Science + Business Media, Inc. 2006

Authors and Affiliations

  1. 1.High Voltage Electron Microscopy StationNational Institute for Materials ScienceTsukubaJapan
  2. 2.High Voltage Electron Microscopy StationNational Institute for Materials ScienceTsukubaJapan
  3. 3.Advanced Science Research LaboratorySaitama Institute of TechnologyOkabe-machiJapan

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