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Microstructure and stresses in a keatite solid–solution glass–ceramic

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Abstract

The microstructure of a translucent keatite solid–solution glass–ceramic (keatite s.s.) of the LAS-system (Li2O–Al2O3–SiO2) has been analyzed with SEM, AFM, XRF, XRD, and TEM. The glass–ceramic consists mainly of keatite s.s. with minor secondary phases such as zirconium titanate, gahnite and probably rutile. Furthermore the resistance to temperature differences (RTD) of this glass–ceramic was investigated. It is shown that, in spite of the relatively high coefficient of thermal expansion (CTE) of about 1 × 10−6 K−1, an improved RTD can be achieved by special ceramization treatment. With this, compressive stresses in the first 100 μm to 150 μm are induced. These stresses can presumably be contributed to a difference in CTE between the surface-near zone and the bulk. Said CTE difference is caused by chemical gradients of CTE-relevant elements, such as Zn, K, and supposedly additional alkali elements such as Li. These stresses are useful to increase the strength and application range of glass–ceramics based on keatite s.s.

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Notes

  1. Because RTD stands for “resistance to temperature difference” it describes strictly speaking a strength [MPa]. Nevertheless according to Eq. (4) here the breakage-temperature [°C] is used as a measure of RTD.

  2. The bars in the average grain-size diagram show the cross-sectional distribution, not the error of the analysis.

Abbreviations

LAS:

Li2O–Al2O3–SiO2

HQ:

High-quartz

CTE:

Coefficient of Thermal Expansion

RTD:

Resistance to Temperature Differences

s.s.:

solid–solution

SEM:

Scanning-Electron Microscopy

TEM:

Transmission Electron Microscopy

EDX:

Energy Dispersive X-ray Spectroscopy

XRF:

X-ray Fluorescence Analysis

XRD:

X-ray Diffraction

RS-XRD:

Residual-Stress X-ray Diffraction

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Correspondence to Christian Roos.

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Roos, C., Becker, O. & Siebers, F. Microstructure and stresses in a keatite solid–solution glass–ceramic. J Mater Sci 42, 50–58 (2007). https://doi.org/10.1007/s10853-006-1045-0

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  • DOI: https://doi.org/10.1007/s10853-006-1045-0

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