Journal of Electronic Testing

, Volume 30, Issue 1, pp 9–23 | Cite as

Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead



The counterfeiting of electronic components has become a major challenge in the 21st century. The electronic component supply chain has been greatly affected by widespread counterfeit incidents. A specialized service of testing, detection, and avoidance must be created to tackle the worldwide outbreak of counterfeit integrated circuits (ICs). So far, there are standards and programs in place for outlining the testing, documenting, and reporting procedures. However, there is not yet enough research addressing the detection and avoidance of such counterfeit parts. In this paper we will present, in detail, all types of counterfeits, the defects present in them, and their detection methods. We will then describe the challenges to implementing these test methods and to their effectiveness. We will present several anti-counterfeit measures to prevent this widespread counterfeiting, and we also consider the effectiveness and limitations of these anti-counterfeiting techniques.


Counterfeit ICs Counterfeit detection and avoidance Electronic component supply chain 



This work was supported in part by the National Science Foundation under grant CNS 1344271, Missile Defense Agency, and Honeywell. The authors would like to thank Steve Walters of Honeywell, and the G-19A group members for providing valuable feedback on the defect taxonomy.


  1. 1.
    Alkabani YM, Koushanfar F (2007) Active hardware metering for intellectual property protection and security. In: Proceedings of 16th USENIX security symposium on USENIX security symposium, pp 20:1–20:16Google Scholar
  2. 2.
    Alkabani Y, Koushanfar F, Potkonjak M (2007) Remote activation of ICs for piracy prevention and digital right management. In: Proceedings of IEEE/ACM international conference on computer-aided design, pp 674–677Google Scholar
  3. 3.
    Arndt K, Narayan C, Brintzinger A, Guthrie W, Lachtrupp D, Mauger J, Glimmer D, Lawn S, Dinkel B, Mitwalsky A (1999) Reliability of laser activated metal fuses in drams. In: Proceedings of IEEE on electronics manufacturing technology symposium, pp 389–394Google Scholar
  4. 4.
    Baumgarten A, Tyagi A, Zambreno J (2010) Preventing IC piracy using reconfigurable logic barriers. IEEE Des Test of Comput 27(1):6–75CrossRefGoogle Scholar
  5. 5.
    Bolotnyy L, Robins G (2007) Physically unclonable function-based security and privacy in rfid systems. In: Proceedings of IEEE international conference on pervasive computing and communications, pp 211–220Google Scholar
  6. 6.
    Bushnell M, Agrawal V (2000) Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits. SpringerGoogle Scholar
  7. 7.
    Cassell J (2012) Reports of counterfeit parts quadruple since 2009. Challenging US Defence Industry and National SecurityGoogle Scholar
  8. 8.
    Chakraborty R, Bhunia S (2008) Hardware protection and authentication through netlist level obfuscation. In: Proceedings of IEEE/ACM international conference on computer-aided design, pp 674 –677Google Scholar
  9. 9.
    Chakraborty R, Bhunia S (2009) HARPOON: an obfuscation-based SoC design methodology for hardware protection. IEEE Trans Comput Aided Des Integr Circ Syst 28(10):1493–1502CrossRefGoogle Scholar
  10. 10.
    Chardonnal D (2011) Impacts of counterfeiting and piracy to reach US$1.7 trillion by 2015Google Scholar
  11. 11.
  12. 12.
    Contreras G, Rahman T, Tehranipoor M (2013) Secure split-test for preventing IC piracy by untrusted foundry and assembly. In: Proceedings of international symposium on fault and defect tolerance in VLSI systemsGoogle Scholar
  13. 13.
    CTI, Components technology institute, Inc.
  14. 14.
    CTI (2010) Comparison of AS 5553, CTI-CCAP-101B, and IDEA-STD-1010-AGoogle Scholar
  15. 15.
    CTI (2011) Certification for coutnerfeit components avoidance program,
  16. 16.
    Departnent of Defense (2010) Test method standard: microcircuits. Available:
  17. 17.
    Departnent of Defense (2012) Test method standard: test methods for semiconductor devices. Available:
  18. 18.
    Eldred RD (1959) Test routines based on symbolic logical statements. J ACM 6(1):33–37CrossRefMATHMathSciNetGoogle Scholar
  19. 19.
    ERAI, Electronic resellers association international (ERAI),
  20. 20.
    Galey JM, Norby RE, Roth JP (1961) Techniques for the diagnosis of switching circuit failures. In: Proceedings of the second annual symposium on switching circuit theory and logical design, pp 152–160Google Scholar
  21. 21.
    Gassend B, Clarke D, van Dijk M, Devadas S (2002) Silicon physical random functions. In: Proceedings of the 9th ACM conference on computer and communications security, ser. CCS ’02. ACM, New York, pp 148–160Google Scholar
  22. 22.
    GIDEP Government-industry data exchange program (GIDEP).
  23. 23.
    Grochowski A, Bhattacharya D, Viswanathan T, Laker K (1997) Integrated circuit testing for quality assurance in manufacturing: history, current status, and future trends. IEEE Trans Circ Syst II: Analog Digit Signal Process 44(8):610–633CrossRefGoogle Scholar
  24. 24.
    Guajardo J, Kumar S, Schrijen G-J, Tuyls P (2007) Physical unclonable functions and public-key crypto for fpga ip protection. In: International conference onfield programmable logic and applications, pp 189–195Google Scholar
  25. 25.
    Guin U, Tehranipoor M (2013) Counterfeit detection technology assessment. In: GOMACTechGoogle Scholar
  26. 26.
    Guin U, Tehranipoor M (2013) On selection of counterfeit ic detection methods. In: IEEE north atlantic test workshop (NATW)Google Scholar
  27. 27.
    Guin U, DiMase D, Tehranipoor M (2014) A comprehensive framework for counterfeit defect coverage analysis and detection assessment. J Electron Test Theory Appl (JETTA) 30(1). doi: 10.1007/s10836-013-5428-2
  28. 28.
    Guin U, Forte D, Tehranipoor M (2013) Anti-Counterfeit techniques: from design to resign. In: Microprocessor test and verification (MTV)Google Scholar
  29. 29.
    Guin U, Tehranipoor M, DiMase D, Megrdician M (2013) Counterfeit IC detection and challenges ahead. In: ACM SIGDAGoogle Scholar
  30. 30.
    Hart AD, Meyers LR, Hernandez C, Morley RE, Richter EJ, Indeck RS (2013) Card authentication system, Patent US8 447 991 B2. Available:
  31. 31.
    Hori Y, Yoshida T, Katashita T, Satoh A (2010) Quantitative and statistical performance evaluation of arbiter physical unclonable functions on FPGAs. In: International conference on reconfigurable computing and FPGAs (ReConFig), pp 298–303Google Scholar
  32. 32.
    Huang J, Lach J (2008) IC Activation and user authentication for security-sensitive systems. In: Proceedings of IEEE international workshop on hardware-oriented security and trust, pp 76–80Google Scholar
  33. 33.
    IDEA, Acceptability of electronic components distributed in the open market.
  34. 34.
    IHS, Information handling services Inc. (IHS),
  35. 35.
    IHS iSuppli (2011) Top 5 most counterfeited parts represent a ¡DOLLAR/¿169 billion potential challenge for global semiconductor marketGoogle Scholar
  36. 36.
    Jensen F, Petersen NE (1982) Burn-in: an engineering approach to the design and analysis of burn-in procedures. WileyGoogle Scholar
  37. 37.
    Jones J (2009) Counterfeit components and acoustic microscopyGoogle Scholar
  38. 38.
    Kessler LW, Sharpe T (2010) Faked parts detection. Circ Assemb J Surf Mt Electron Assemb.
  39. 39.
    Koushanfar F, Qu G, Potkonjak M (2001) Intellectual property metering. In: Information hiding. Springer-Verlag, pp 81–95Google Scholar
  40. 40.
    Koushanfar F, Qu G (2001) Hardware metering. In: Proceedings IEEE-ACM design automation conference, pp 490–493Google Scholar
  41. 41.
    Kuemin C, Nowack L, Bozano L, Spencer ND, Wolf H (2012) Oriented assembly of gold nanorods on the single-particle level. Adv Funct Materi 22(4):702–708CrossRefGoogle Scholar
  42. 42.
    Kumar S, Guajardo J, Maes R, Schrijen G-J, Tuyls P (2008) Extended abstract: the butterfly puf protecting ip on every fpga. In: Proceedings of IEEE international workshop on hardware-oriented security and trust, pp 67–70Google Scholar
  43. 43.
    Kursawe K, Sadeghi A-R, Schellekens D, Skoric B, Tuyls P (2009) Reconfigurable physical unclonable functions—enabling technology for tamper-resistant storage. In: Proceedings of IEEE international workshop on hardware-oriented security and trust, pp 22–29Google Scholar
  44. 44.
    Maiti A, Gunreddy V, Schaumont PA systematic method to evaluate and compare the performance of physical unclonable functions. Available:
  45. 45.
    Marshall M (2011) Best detection methods for counterfeit componentsGoogle Scholar
  46. 46.
    Lee J, Lim D, Gassend B, Suh G, van Dijk M, Devadas S (2004) A technique to build a secret key in integrated circuits for identification and authentication applications. In: Proceedings of digest of technical papers on VLSI circuits, pp 176–179Google Scholar
  47. 47.
    Lofstrom K, Daasch W, Taylor D (2000) Ic identification circuit using device mismatch. In: Proceedings of IEEE international solid-state circuits conference, pp 372–373Google Scholar
  48. 48.
    Mazumder P, Chakraborty K (1996) Testing and testable design of high-density random-access memories. SpringerGoogle Scholar
  49. 49.
    Miller M, Meraglia J, Hayward J (2012) Traceability in the age of globalization: a proposal for a marking protocol to assure authenticity of electronic parts. In: SAE aerospace electronics and avionics systems conferenceGoogle Scholar
  50. 50.
    Morley RE, Richter EJ, Engel GL (2007) Method and apparatus for authenticating a magnetic fingerprint signal using an adaptive analog to digital converter. Patent US7 210 627 B2. Available:
  51. 51.
    Mouli C, Carriker W (2007) Future Fab: how software is helping Intel go nano—and beyond. IEEE Spectr 44(3):38–43CrossRefGoogle Scholar
  52. 52.
    Nelson GF, Boggs WF (1975) Parametric tests meet the challenge of high-density ICs. Electronics 48(5):108–111Google Scholar
  53. 53.
    OECD (2007) The economic impact of counterfeiting and piracy.
  54. 54.
    Pappu R (2001) Physical one-way functions. Ph.D. dissertation, Massachusetts Institute of TechnologyGoogle Scholar
  55. 55.
    Poage JF (1963) Derivation of optimal tests to detect faults in combinational circuits. In: Proceedings of the symposium on mathematical theory of automata, pp 483–528Google Scholar
  56. 56.
    Robson N, Safran J, Kothandaraman C, Cestero A, Chen X, Rajeevakumar R, Leslie A, Moy D, Kirihata T, Iyer S (2007) Electrically programmable fuse (eFUSE): from memory redundancy to autonomic chips. In: CICC, pp 799–804Google Scholar
  57. 57.
    Roy J, Koushanfar F, Markov I (2008) EPIC: ending piracy of integrated circuits. In: Proceedings on design, automation and test in Europe, pp 1069–1074Google Scholar
  58. 58.
  59. 59.
    SAE, SAE International,
  60. 60.
    SAE (2009) Counterfeit electronic parts; avoidance, detection, mitigation, and dispositionGoogle Scholar
  61. 61.
    Semiconductor Industry Association (SIA) (2012) Public comments—DNA authentication marking on items in FSC5962Google Scholar
  62. 62.
    Seshu S, Freeman DN (1962) The diagnosis of asynchronous sequential switching systems. IRE Trans Electron Comput EC-11(4):459–465CrossRefMathSciNetGoogle Scholar
  63. 63.
    Soma M (1993) Fault coverage of dc parametric tests for embedded analog amplifiers. In: Proceedings on international test conference, pp 566–573Google Scholar
  64. 64.
    Suh G, Devadas S (2007) Physical unclonable functions for device authentication and secret key generation. In: Proceedings of ACM/IEEE on design automation conference, pp 9–14Google Scholar
  65. 65.
    Suh GE, Clarke D, Gassend B, van Dijk M, Devadas S (2003) Aegis: architecture for tamper-evident and tamper-resistant processing. In: Proceedings of the 17th annual international conference on supercomputing, ser. ICS ’03. New York, ACM, pp 160–171Google Scholar
  66. 66.
    Su Y, Holleman J, Otis B (2007) A 1.6pj/bit 96 circuit using process variations. In: Proceedings of IEEE international on solid-state circuits conference, pp 406–611Google Scholar
  67. 67.
    Suk D, Reddy S (1981) A march test for functional faults in semiconductor random access memories. IEEE Trans Comput C-30(12):982–985CrossRefGoogle Scholar
  68. 68.
    Tehranipoor M, Koushanfar F (2010) A survey of hardware trojan taxonomy and detection. IEEE Des Test Comput 27(1):10–25CrossRefGoogle Scholar
  69. 69.
  70. 70.
    US (2010) Department Of commerce, defense industrial base assessment: counterfeit electronicsGoogle Scholar
  71. 71.
    US Congress (2011) Ike skelton national defense authorization act for fiscal year. Available:
  72. 72.
    US Defense Logistics Agency (2012) Dna authentication marking on items in fsc 5962. Available:
  73. 73.
    US Environmental Protection Agency (2011) Electronic waste management in the united states through 2009Google Scholar
  74. 74.
    US Senate Committee on armed services (2012) Inquiry into counterfeit electronic parts in the department of defence supply chainGoogle Scholar
  75. 75.
    US Senate Committee on armed services (2012) Suspect counterfeit electronic parts can be found on internet purchasing platforms, Available:
  76. 76.
    Wang X, Tehranipoor M (2010) Novel physical unclonable function with process and environmental variations. In: Proceedings on design, automation test in europe conference exhibition (DATE), pp 1065–1070Google Scholar
  77. 77.
    Yu M-DM, Sowell R, Singh A, M’Rahi D, Devadas S (2012) Performance metrics and empirical results of a PUF cryptographic key generation ASIC. In: HOST, pp 108–115Google Scholar
  78. 78.
    Zhang X, Tehranipoor M (2013) Design of on-chip light-weight sensors for effective detection of recycled ICs. In: IEEE transactions on VLSI systemsGoogle Scholar
  79. 79.
    Zhang X, Tuzzio N, Tehranipoor M (2012) Identification of recovered ICs using fingerprints from a light-weight on-chip sensor. In: Proceedings on IEEE-ACM design automation conference, pp 703–708Google Scholar

Copyright information

© Springer Science+Business Media New York 2014

Authors and Affiliations

  • Ujjwal Guin
    • 1
  • Daniel DiMase
    • 2
  • Mohammad Tehranipoor
    • 1
  1. 1.ECE DepartmentUniversity of ConnecticutStorrsUSA
  2. 2.Honeywell Inc.MorristownUSA

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