Journal of Electronic Testing

, Volume 28, Issue 6, pp 791–802 | Cite as

Prediction of Long-term Immunity of a Phase-Locked Loop

  • A. Boyer
  • S. Ben Dhia
  • B. Li
  • C. Lemoine
  • B. Vrignon


Degradation mechanisms accelerated by harsh conditions (high temperature, electrical stress) can affect circuit performances. Submitted to electromagnetic interferences, aged components can become more susceptible, which stirs up questions about the safety level of the final application. Unfortunately, the impact of circuit aging on its susceptibility level remains under evaluated and is not taken into account at circuit design level. This paper presents a first attempt of a modeling methodology aiming at predicting the impact of circuit aging on the susceptibility to electromagnetic interferences. This methodology is applied to model and explain the measured variations of the susceptibility level of phase-locked loop after an accelerated-life test.


Integrated circuits Susceptibiity to electromagnetic interferences Immunity modelling, circuit aging, reliability 



This study has been done with the financial support of French National Research Agency (project EMRIC JC09_433714) and the regional council of Midi-Pyrénées.


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Copyright information

© Springer Science+Business Media New York 2012

Authors and Affiliations

  • A. Boyer
    • 1
    • 2
  • S. Ben Dhia
    • 1
    • 2
  • B. Li
    • 3
  • C. Lemoine
    • 4
  • B. Vrignon
    • 5
  1. 1.CNRS, LAASToulouse Cedex 4France
  2. 2.Université de ToulouseUPS, INSA, INP, ISAE ; UT1, UTM, LAASToulouse Cedex 4France
  3. 3.Institute of MicroelectronicsChinese Academy of SciencesBeijingChina
  4. 4.INSA de ToulouseUniversité de ToulouseToulouseFrance
  5. 5.Freescale SemiconductorToulouseFrance

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