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Reliability Limits of TMR Implemented in a SRAM-based FPGA: Heavy Ion Measures vs. Fault Injection Predictions

  • Gilles Foucard
  • Paul Peronnard
  • Raoul Velazco
Article

Abstract

This paper presents experimental results putting in evidence the potential weaknesses of a state-of-the-art fault tolerance strategy, the Triple Modular Redundancy (TMR), when implemented in SRAM-based FPGAs. HW/SW fault injection campaigns and accelerated radiation ground tests were performed to quantify the number of faults, Single Event Upsets (SEUs) required to obtain such critical failures.

Keywords

TMR FPGA SRAM SEUs Laser tests Fault injection Heavy ions 

Notes

Acknowledgment

Authors thanks Dr. Gary Swift from Xilinx Corporation for his support to the X-TMR version of the application, Dr. Vincent Pouget, from IMS/CNRS, for his support for laser test experiments and finally M. Guy Berger, from UCL, for his support will performing heavy ion ground testing.

References

  1. 1.
    Berger G, Ryckewaert G, Harboe-Sorensen R, Adams L (1996) The heavy ion irradiation facility at CYCLONE - a dedicated SEE beam line. IEEE NSREC WorkshopGoogle Scholar
  2. 2.
    Berger G, Ryckewaert G, Harboe-Sorensen R (1997) CYCLONE – A Multipurpose Heavy Ion, Proton and Neutron SEE Test Site, RADECS Workshop, 51–55Google Scholar
  3. 3.
    Caffrey M, Graham P, Johnson E, Wirthlin M (2002) Single-event upsets in SRAM FPGAs. in Proc. of the military and aerospace applications of programmable devices Int’l conference (MAPLD)Google Scholar
  4. 4.
    Faure F, Peronnard P, Velazco R (2002) Thesic+: A flexible system for see testing, in Proc. of RADECSGoogle Scholar
  5. 5.
    Kastensmidt FL, Sterpone L, Carro L, Reorda MS (2005) On the optimal design of triple modular redundancy logic for SRAM-based FPGAs, Proc. Of Design, Automation and Test in Europe (DATE) 2005. 2:1290–1295Google Scholar
  6. 6.
    Koga R, George J, Swift G, Yui C, Edmonds L, Carmichael C, Langley T, Murray P, Lanes K, Napier M (2004) Comparison of Xilinx Virtex-II FPGA SEE sensitivities to protons and heavy ions. IEEE Trans Nucl Sci 51(5):2825–2833CrossRefGoogle Scholar
  7. 7.
    Ma T, Dressendorfer P (1989) Ionizing radiation effects in MOS devices and circuits. Wiley, New YorkGoogle Scholar
  8. 8.
    Manuzzato A, Gerardin S, Paccagnella A, Sterpone L, Violante M (2008) Effectiveness of TMR-based techniques to mitigate alpha-induced SEU accumulation in commercial SRAM-based FPGAs. Nuclear Science, IEEE Transactions on 55(4):1968–1973CrossRefGoogle Scholar
  9. 9.
  10. 10.
    Morgan K, Caffrey M, Graham P, Johnson E, Pratt B, Wirthlin M (2005) SEU-induced persistent error propagation in FPGAs. IEEE Trans Nucl Sci 52(6):2438–2445CrossRefGoogle Scholar
  11. 11.
    Normand E (1966) Single-event effects in avionics. IEEE Trans Nucl Sci 43(2):461–474CrossRefGoogle Scholar
  12. 12.
  13. 13.
    Pouget V, Fouillat P, Lewis D (2006) Using the SEEM software for SET testing and analysis, Radiation effects in embedded systems, to be published by SpringerGoogle Scholar
  14. 14.
    Pouget V, Wan D, Jaulent P, Douin A, Lewis D, Fouillat P (2006) Recent developments for SEE testing at the ATLAS laser facility. Proc. of 15th Single-Event Effects SymposiumGoogle Scholar
  15. 15.
    Pouget V, Douin A, Lewis D, Fouillat P, Foucard G, Peronnard P, Maingot V, Ferron JB, Anghel L, Leveugle R, Velazco R (2007) Tools and Methodology Development for Pulsed Laser Fault Injection in SRAM-Based FPGAs, 8th Latin American Test Workshop (LATW 2007), [Cusco (Peru), 11–14].Google Scholar
  16. 16.
    Xilinx (2005) Virtex-II platform FPGAs: complete data sheet, http://www.xilinx.com, March
  17. 17.
    XTMR Tool User Guide (2004) Xilinx User guide UG156Google Scholar

Copyright information

© Springer Science+Business Media, LLC 2011

Authors and Affiliations

  1. 1.Laboratoire TIMAGrenobleFrance

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