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An Optimized Seed-based Pseudo-random Test Pattern Generator: Theory and Implementation

  • Haijun Sun
  • Yongjia Zeng
  • Pu Li
  • Shaochong Lei
  • Zhibiao Shao
Article
  • 181 Downloads

Abstract

This paper presents a novel seed-based test pattern generator (SB-TPG). The core of SB-TPG is a seed sequence generator. A coverage-driven seed generation algorithm has been proposed to generate the optimized seeds. The test sequence generated by SB-TPG is a single input change (SIC) sequence that can significantly reduce test power for test-per-clock built-in self-test (BIST). Further, seed-masking technique has been put forward to filter those power-consuming seeds, thus reducing test power for test-per-scan BIST. Experimental results show that SB-TPG can achieve high fault coverage with short test length, low power and small hardware overhead.

Keywords

Test pattern generator (TPG) Seed Single input change (SIC) sequence Built-in self-test (BIST) Fault coverage Low power 

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Copyright information

© Springer Science+Business Media, LLC 2011

Authors and Affiliations

  • Haijun Sun
    • 1
  • Yongjia Zeng
    • 2
  • Pu Li
    • 2
  • Shaochong Lei
    • 2
  • Zhibiao Shao
    • 2
  1. 1.School of Information EngineeringZhengzhou UniversityZhengzhouChina
  2. 2.Department of MicroelectronicsXi’an Jiao Tong UniversityXi’anChina

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