Journal of Electronic Testing

, Volume 26, Issue 6, pp 679–688 | Cite as

Modified Selective Huffman Coding for Optimization of Test Data Compression, Test Application Time and Area Overhead

  • Usha Sandeep Mehta
  • Kankar S. Dasgupta
  • Nirnjan M. Devashrayee


A compression-decompression scheme, Modified Selective Huffman (MS-Huffman) scheme based on Huffman code is proposed in this paper. This scheme aims at optimization of the parameters that influence the test cost reduction: the compression ratio, on-chip decoder area overhead and overall test application time. Theoretically, it is proved that the proposed scheme gives the better test data compression compared to very recently proposed encoding schemes for any test set. It is clearly demonstrated with a large number of experimental results that the proposed scheme improves the test data compression, reduces overall test application time and on-chip area overhead compared to other Huffman code based schemes.


IP core based SoC Huffman code Optimal selective Huffman code Test-data compression Test application time On-chip area-overhead 



The authors are thankful to Prof. Nur A. Tauba for providing MINTEST test sets for ISCAS89 benchmark circuits.


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Copyright information

© Springer Science+Business Media, LLC 2010

Authors and Affiliations

  • Usha Sandeep Mehta
    • 1
  • Kankar S. Dasgupta
    • 2
  • Nirnjan M. Devashrayee
    • 1
  1. 1.Nirma UniversityAhmedabadIndia
  2. 2.Space Application CenterISROAhmedabadIndia

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