Journal of Electronic Testing

, Volume 25, Issue 1, pp 1–1 | Cite as



As I reported in December 2008, JETTA Editorial Board held its annual meeting in Sunnyvale, California, on October 29, 2008. It was attended by 18 editors and guest editors, and Charles Glaser of Springer. The Board approved a special issue on mixed-signal test to be published in late 2009 or early 2010, under the guest editorship of Karim Arabi.

The Editorial Board also approved the appointments of two new editors, Xiaowei Li and Nur Touba. We welcome them. Their biographies and photographs appear in this issue. Two of our continuing editors will change their responsibilities. Mohammad Tehranipoor will be the editor for the TTTC Newsletter and Bruce Kim, who had that responsibility until now, will continue as a regular editor.

JETTA has a peer review policy of selecting papers. While our editors are recognized experts in their areas of expertise, peer evaluation has an essential role. The process begins upon my assigning an editor to a submitted paper. The editor then identifies several individuals with expertise and interest in the subject area of the paper. Requests for reviews are then sent to them. Once three reviews are received, the editor examines them and communicates a decision to me. Most accepted papers are revised based upon the comments from the reviewers and the responsible editor. We are extremely grateful to our reviewers for their valuable service to the profession. A list of those who reviewed papers for JETTA in 2008 appears in this issue.

This is a special issue featuring the theme of Defect and Fault-Tolerance. Guest editors, Cristiana Bolchini and Yong-Bin Kim, meticulously carried out the journal’s peer review and revision process in a timely manner. I thank them for their effort. Please read their guest editorial to find out more about this issue.

Copyright information

© Springer Science+Business Media, LLC 2009

Authors and Affiliations

  1. 1.ECE DepartmentAuburn UniversityAuburnUSA

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