Journal of Electronic Testing

, Volume 24, Issue 1–3, pp 5–6 | Cite as

Test Technology Newsletter February 2008

Open image in new windowThe Newsletter of the Test Technology Technical Council of the IEEE Computer SocietyOpen image in new window

Editor: Bruce Kim


9thLatin American Test Workshop (LATW)

17–20 February 2008, Puebla, Mexico

The IEEE Latin-American Test Workshop provides an annual forum for test and fault tolerance professionals and technologists from Latin America and all over the world to present and discuss various aspects of system, board and component testing and fault-tolerance with design, manufacturing and field considerations in mind. The best papers presented at the 9th LATW will be invited for submission to the IEEE Design and Test of Computers and Journal of Integrated Circuits and Systems.

Design, Automation and Test in Europe Conference (DATE 08)

10–14 March 2008, Munich, Germany

DATE is the main European event that brings together designers and design automation users; researchers; and vendors; as well as specialists in hardware and software design, test, and the manufacturing of electronic circuits and...

Copyright information

© Springer Science+Business Media, LLC 2008

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