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Journal of Electronic Testing

, Volume 24, Issue 4, pp 325–326 | Cite as

Guest Editorial

  • Nicola Nicolici
  • Patrick Girard
Article
  • 32 Downloads

Copyright information

© Springer Science+Business Media, LLC 2008

Authors and Affiliations

  1. 1.Department of ECEMcMaster UniversityHamilton Canada
  2. 2.Laboratory of Informatics, Robotics and Microelectronics of Montpellier (LIRMM)MontpellierFrance

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