Journal of Electronic Testing

, Volume 23, Issue 2–3, pp 113–114 | Cite as

Test Technology Newsletter April 2007

Open image in new windowThe Newsletter of the Test Technology Technical Council of the IEEE Computer SocietyOpen image in new window

Copyright information

© Springer Science + Business Media, LLC 2007

Authors and Affiliations

  1. 1.Department of Electrical and Computer EngineeringUniversity of AlabamaTuscaloosaUSA

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